MX25L8005
Table 6. AC CHARACTERISTICS (Temperature = -40°C to 85° C for Industrial grade, Temperature =
0° C to 70°C for Commercial grade, VCC = 2.7V ~ 3.6V)
Symbol
Alt.
Parameter
Min.
Typ. Max.
Unit
fSCLK
fC
Clock Frequency for the following instructions:
FAST_READ, PP, SE, BE, CE, DP, RES,RDP
WREN, WRDI, RDID, RDSR, WRSR
1KHz
70 & 86 MHz
(Condition:15pF)
66
MHz
(Condition:30pF)
fRSCLK
tCH(1)
fR
Clock Frequency for READ instructions
1KHz
7
33
MHz
tCLH Clock High Time
tCLL Clock Low Time
ns
ns
V/ns
V/ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
us
us
us
ms
ms
ms
s
tCL(1)
7
tCLCH(2)
tCHCL(2)
tSLCH
tCHSL
tDVCH
tCHDX
tCHSH
tSHCH
tSHSL
Clock Rise Time (3) (peak to peak)
0.1
0.1
5
Clock Fall Time (3) (peak to peak)
tCSS CS# Active Setup Time (relative to SCLK)
CS# Not Active Hold Time (relative to SCLK)
tDSU Data In Setup Time
5
2
tDH
Data In Hold Time
5
CS# Active Hold Time (relative to SCLK)
CS# Not Active Setup Time (relative to SCLK)
5
5
tCSH CS# Deselect Time
100
tSHQZ(2) tDIS Output Disable Time
6
8
6
tCLQV
tV
Clock Low to Output Valid @33MHz 30pF
@86MHz/70MHz 15pF or @66MHz 30pF
0
tCLQX
tHLCH
tCHHH
tHHCH
tCHHL
tHO
Output Hold Time
HOLD# Setup Time (relative to SCLK)
HOLD# Hold Time (relative to SCLK)
HOLD Setup Time (relative to SCLK)
HOLD Hold Time (relative to SCLK)
HOLD to Output Low-Z
5
5
5
5
tHHQX(2) tLZ
tHLQZ(2) tHZ
tWHSL(4)
tSHWL(4)
tDP(2)
6
6
HOLD#toOutputHigh-Z
Write Protect Setup Time
20
Write Protect Hold Time
100
CS#HightoDeepPower-downMode
CS# High to Standby Mode without Electronic Signature Read
CS# High to Standby Mode with Electronic Signature Read
Write Status Register Cycle Time
Page Program Cycle Time
3
3
tRES1(2)
tRES2(2)
tW
1.8
15
5
5
1.4
60
1
tPP
tSE
Sector Erase Cycle Time
120
2
tBE
Block Erase Cycle Time
tCE
Chip Erase Cycle Time
7
15
s
Note:
1. tCH + tCL must be greater than or equal to 1/ fC
2. Value guaranteed by characterization, not 100% tested in production.
3. Expressed as a slew-rate.
4. Only applicable as a constraint for a WRSR instruction when SRWD is set at 1.
5. Test condition is shown as Figure 3.
P/N:PM1237
REV. 2.2, OCT. 23, 2008
21