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MAX1644EAE 参数 Datasheet PDF下载

MAX1644EAE图片预览
型号: MAX1644EAE
PDF下载: 下载PDF文件 查看货源
内容描述: 塑封器件 [PLASTIC ENCAPSULATED DEVICES]
分类和应用: 稳压器开关式稳压器或控制器电源电路开关式控制器光电二极管
文件页数/大小: 8 页 / 136 K
品牌: MAXIM [ MAXIM INTEGRATED PRODUCTS ]
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V. Quality Assurance Information
A. Quality Assurance Contacts: Jim Pedicord (Reliability Lab Manager)
Bryan Preeshl (Executive Director of QA)
Kenneth Huening (Vice President)
B. Outgoing Inspection Level:
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate: < 50 ppm
D. Sampling Plan: Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135°C biased (static) life test are shown in
Table 1.
Using these results, the Failure
Rate (λ) is calculated as follows:
λ
=
1
=
MTTF
1.83
(Chi square value for MTTF upper limit)
192 x 4389 x 239 x 2
Temperature Acceleration factor assuming an activation energy of 0.8eV
λ
= 4.54 x 10
-9
λ
= 4.54 F.I.T. (60% confidence level @ 25°C)
This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.
Maxim also performs weekly Burn-In on samples from production to assure reliability of its processes. The
reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates
to 3 failures in an 80 piece sample. Maxim performs failure analysis on rejects from lots exceeding this level. The
attached Burn-In Schematic (Spec. # 06-5250) shows the static circuit used for this test. Maxim also performs
1000 hour life test monitors quarterly for each process. This data is published in the Product Reliability Report (RR-
1M).
B. Moisture Resistance Tests
Maxim evaluates pressure pot stress from every assembly process during qualification of each new design.
Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard 85°C/85%RH or
HAST tests are performed quarterly per device/package family.
C. E.S.D. and Latch-Up Testing
The PX05 die type has been found to have all pins able to withstand a transient pulse of ±1500V, per Mil-
Std-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device
withstands a current of
±250mA
and/or
±20V.