DA6510.009
6 September, 2018
REGISTER AND EEPROM DATA ADDRESSES
MAS6510 includes a 32 byte (256 bit) EEPROM data
memory and fourteen registers. Five bytes (40 bits)
of EEPROM are reserved for trim values and
programmable I2C device address but the remaining
27 bytes (216 bits) are free for storing sensor
calibration and other data. See table 1 on the
previous page for register and EEPROM data
addresses.
The Measurement control register (E2/62HEX) is used
for configuring and starting an A/D conversion.
The CS_INT (E3/63HEX) and the CR_INT (E4/64HEX
)
capacitor matrix registers select internal capacitors
which are connected from CC pin to the CS and to
the CR pins respectively. Both matrix capacitor
values can be chosen independently between 0pF
and 22pF in 86.3fF steps.
In the SPI serial bus the address bit A7 selects
between write (A7=0) and read (A7=1) operation. In
the I2C serial bus A7 is always high (A7=1) and
selection between write and read operation is done
with the LSB bit of the I2C device address. See table
11 in chapter SERIAL DATA INTERFACE
CONTROL. The MAS6510 has both hard wired and
programmable I2C device addresses. The
The Gain register (E5/65HEX) controls the gain of the
CDC front-end. Gain value together with the CS_INT
and CR_INT values determine input capacitance
conversion range.
The Oscillator frequency control register (E6/66HEX
)
is used only during internal clock oscillator trimming.
During trimming there is searched register value
which gives closest to the nominal 200 kHz oscillator
frequency. However the internal clock oscillator
frequency is trimmed by MAS during wafer level
testing and the trimming value is stored into the
Oscillator frequency trim data EEPROM address
(C6/46HEX). Thus there is no need to adjust the
factory stored clock oscillator trimming value. In
normal operation the trim value is automatically read
from the EEPROM memory in the beginning of each
conversion.
programmable
device
address
is
factory
programmed to value EC HEX (%11101100) which is
the same as the hard wired device address of
MAS6510. When unique device address is needed
it can be programmed to the Programmable I2C
Device Address register (C2HEX). The MAS6510 will
respond to both hard wired and programmed I2C
device addresses.
MAS6510 has four trim registers: CS_INT capacitor
matrix register (E3/63HEX), CR_INT capacitor matrix
register (E4/64HEX), Gain register (E5/65HEX) and
Oscillator frequency control register (E6/66HEX).
These are marked with “R+T” in table 1. Each of
these registers has a corresponding EEPROM byte
where trim values can be permanently stored. These
are marked with “E+T” in table 1. Trim values are
automatically read from EEPROM in the beginning
of each conversion when this feature is enabled in
the trimming control register (EE/6EHEX). When
disabled it is possible to test different trim data in the
trim registers before final trimming values are found
and stored in the EEPROM.
EEPROM write enable register (E9/69HEX) is used for
enabling EEPROM write since by default the
EEPROM is write protected.
The 24-bit A/D conversion result (capacitance or
temperature) is stored into three registers EAHEX
(MSB, most significant byte), EBHEX (ISB,
intermediate significant byte), ECHEX (LSB, least
significant byte).
The EEPROM status register (ED/6DHEX) reflects the
EEPROM error correction status. This register can
be used to verify that the EEPROM operation has
finished without errors.
Reset register (E0/60HEX) does not contain any data.
Any dummy data written to this register forces a
reset. A reset initializes all control registers
(addresses E1HEX…EEHEX) to a zero value.
The Trimming control register (EE/6EHEX) defines
whether the trim data in the EEPROM or in the
registers are used during operation. The default
setting is that all trim data is automatically read from
the EEPROM memory in the beginning of each
conversion. See the Trimming control register
description for details.
Test register (E1/61HEX) is mainly used for testing
and trimming purposes. See table 2 in chapter TEST
REGISTER. If an external clock signal is used the
test register is needed for selecting the external
clock signal.
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