Specifications
GAL22LV10C
Specifications
GAL22LV10
AC SWITCHING CHARACTERISTICS
Over Recommended Operating Conditions
COM
PARAM
TEST
COND.
1
COM
COM
DESCRIPTION
Input or I/O to Combinatorial Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Fdbk before Clk↑
Hold Time, Input or Fdbk after Clk↑
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
Input or I/O to Output Disabled
Input or I/O to Asynch. Reset of Reg.
Asynch. Reset Pulse Duration
Asynch. Reset to Clk↑ Recovery Time
Synch. Preset to Clk↑ Recovery Time
2
1
—
6.5
0
87
-7
-10
-15
UNITS
ns
ns
ns
ns
ns
MHz
MIN. MAX. MIN. MAX. MIN. MAX.
7.5
5
3
—
—
—
2
1
—
7.5
0
71
10
6.5
5
—
—
—
2
1
—
10
0
50
15
10
5
—
—
—
t
pd
2
t
co
2
t
cf
3
t
su
t
h
A
A
—
—
—
A
f
max
4
A
A
105
125
—
—
80
111
—
—
66
83
—
—
MHz
MHz
t
wh
t
wl
t
en
t
dis
t
ar
t
arw
t
arr
t
spr
—
—
B
C
A
—
—
—
3.5
3.5
2
2
2
7
7
8
—
—
10
10
11
—
—
—
4
4
2
2
2
8
8
10
—
—
12
12
13
—
—
—
6
6
2
2
2
12
10
10
—
—
15
15
20
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Minimum values for
tpd
and
tco
are not 100% tested but established by characterization.
3) Calculated from
fmax
with internal feedback. Refer to
fmax Description
section.
4) Refer to
fmax Description
section.
CAPACITANCE (T
A
= 25
°
C, f = 1.0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
TYPICAL
8
8
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 3.3V, V
I
= 0V
V
CC
= 3.3V, V
I/O
= 0V
9
LATTICE [ LATTICE SEMICONDUCTOR ]
