Specifications
GAL22LV10C
Specifications
GAL22LV10
ABSOLUTE MAXIMUM RATINGS
(1)
Supply voltage V
CC
....................................
-
0.5 to +5.6V
Input voltage applied ................................. -0.5 to +5.6V
Off-state output voltage applied................. -0.5 to +5.6V
Storage Temperature.................................. -65 to 150°C
Ambient Temperature with
Power Applied ......................................... -55 to 125°C
1. Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device
at these or at any other conditions above those indicated in
the operational sections of this specification is not implied
(while programming, follow the programming specifications).
RECOMMENDED OPERATING COND.
Commercial Devices:
Ambient Temperature (T
A
) ............................. 0 to +75°C
Supply voltage (V
CC
)
with Respect to Ground ......................... +3.0 to +3.6V
DC ELECTRICAL CHARACTERISTICS
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL
PARAMETER
Input Low Voltage
Input High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
0V
≤
V
IN
≤
V
IL
(MAX.)
(V
CC
- 0.2)V
≤
V
IN
≤
V
CC
V
CC
≤
V
IN
≤
5.25V
CONDITION
MIN.
Vss – 0.5
TYP.
2
—
—
—
—
—
—
—
—
—
—
—
—
—
MAX.
0.8
5.25
UNITS
V
V
µA
µA
mA
V
V
V
V
V
mA
mA
mA
V
IL
V
IH
I
IL
I
IH
V
OL
V
OH
2.0
—
—
—
—
—
2.4
Vcc-0.45
Vcc-0.2
—
—
V
CC
= 3.3V
V
OUT
= 0.5V
T
A
= 25°C
-15
-
10
10
30
0.4
0.2
—
—
—
8
-4
-60
Output Low Voltage
I
OL
= MAX.
Vin
=
V
IL
or
V
IH
I
OL
= 0.5 mA
Vin
=
V
IL
or
V
IH
Output High Voltage
I
OH
= MAX.
Vin
=
V
IL
or
V
IH
I
OH
= -0.5 mA
Vin
=
V
IL
or
V
IH
I
OH
= -100
µA
Vin
=
V
IL
or
V
IH
I
OL
I
OH
I
OS
1
Low Level Output Current
High Level Output Current
Output Short Circuit Current
COMMERCIAL
I
CC
Operating Power
Supply Current
V
IL
= 0.0V
V
IH
= 3.0V
f
toggle
= 1MHz Outputs Open
—
45
75
mA
1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems by tester ground
degradation. Characterized but not 100% tested.
2) Typical values are at Vcc = 3.3V and T
A
= 25
°C
8
LATTICE [ LATTICE SEMICONDUCTOR ]
