Specifications GAL16VP8
AC Switching Characteristics
Over Recommended Operating Conditions
COM
-15
COM
-25
TEST
DESCRIPTION
PARAMETER
UNITS
COND1.
MIN. MAX.
MIN. MAX.
tpd
tco
tcf2
tsu
th
A
A
Input or I/O to Combinational Output
3
2
15
10
4.5
—
3
2
25
15
10
—
ns
ns
ns
ns
Clock to Output Delay
—
—
Clock to Feedback Delay
—
8
—
10
Setup Time, Input or Feedback before Clock↑
Hold Time, Input or Feedback after Clock↑
—
0
—
—
0
—
—
ns
A
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
55.5
40
MHz
fmax3
A
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
80
80
—
—
50
50
—
—
MHz
MHz
Maximum Clock Frequency with
No Feedback
twh
twl
—
—
B
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
OE to Output Enabled
6
—
—
15
12
15
12
10
10
—
—
—
—
—
—
20
15
20
15
ns
ns
ns
ns
ns
ns
6
ten
—
—
—
—
B
tdis
C
Input or I/O to Output Disabled
OE to Output Disabled
C
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Specification section.
3) Refer to fmax Specification section.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
UNITS
pF
TEST CONDITIONS
VCC = 5.0V, VI = 2.0V
VCC = 5.0V, VI/O = 2.0V
CI
10
15
CI/O
pF
*Characterized but not 100% tested.
11
LATTICE [ LATTICE SEMICONDUCTOR ]
