SpSepceifcicifaictaiotinosnGs GALA1L61V68VD8
AC Switching Characteristics
Over Recommended Operating Conditions
COM / IND COM / IND
IND
-20
COM / IND
-25
-10
-15
TEST
COND1.
DESCRIPTION
PARAM.
UNITS
MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX.
tpd
tco
tcf2
tsu
th
A
A
Input or I/O to Comb. Output
Clock to Output Delay
3
2
10
7
3
2
15
10
8
3
2
20
11
9
3
2
25
12
10
—
ns
ns
ns
ns
—
—
Clock to Feedback Delay
—
7.5
6
—
12
—
13
—
15
Setup Time, Input or Fdbk before Clk↑
Hold Time, Input or Fdbk after Clk↑
—
—
—
—
A
0
—
—
0
—
—
0
—
—
0
—
—
ns
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
66.7
45.5
41.6
37
MHz
fmax3
A
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
71.4
83.3
—
—
50
—
—
45.4
50
—
—
40
—
—
MHz
MHz
Maximum Clock Frequency with
No Feedback
62.5
41.6
twh
twl
ten
t
—
—
B
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
OE to Output Enabled
6
6
1
1
1
1
—
—
10
10
10
10
8
—
—
15
15
15
15
10
10
—
—
—
—
—
—
18
18
18
18
12
12
—
—
—
—
—
—
20
20
20
20
ns
ns
ns
ns
ns
ns
8
—
—
—
—
B
tdis
t
C
Input or I/O to Output Disabled
OE to Output Disabled
C
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
3) Refer to fmax Descriptions section. Characterized but not 100% tested.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
UNITS
TEST CONDITIONS
VCC = 5.0V, VI = 2.0V
VCC = 5.0V, VI/O = 2.0V
CI
8
8
pF
pF
CI/O
*Characterized but not 100% tested.
12
LATTICE [ LATTICE SEMICONDUCTOR ]
