Specifications GAL16V8D
AC Switching Characteristics
Over Recommended Operating Conditions
COM
-5
COM / IND
-7
COM
-3
TEST
DESCRIPTION
PARAMETER
UNITS
COND1.
MIN. MAX. MIN. MAX. MIN. MAX.
tpd
tco
tcf2
A
A
Input or I/O to Comb. Output
Clock to Output Delay
1
1
3.5
3
1
1
5
4
3
1
1
7.5
5
ns
ns
ns
—
Clock to Feedback Delay
—
2.5
—
—
3
tsu
th
—
—
A
Setup Time, Input or Feedback before Clock↑
Hold Time, Input or Feedback after Clock↑
2.5
0
—
—
—
3
0
—
—
5
0
—
—
—
ns
ns
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
182
142.8 — 100
MHz
A
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
200
250
—
—
166
166
—
—
125
125
—
—
MHz
MHz
fmax3
Maximum Clock Frequency with
No Feedback
twh
twl
—
—
Clock Pulse Duration, High
Clock Pulse Duration, Low
24
24
—
—
34
34
—
—
4
4
—
—
ns
ns
ten
B
B
Input or I/O to Output Enabled
—
—
4.5
4.5
1
1
6
6
1
1
9
6
ns
ns
OE to Output Enabled
tdis
C
C
Input or I/O to Output Disabled
—
—
4.5
4.5
1
1
5
5
1
1
9
6
ns
ns
OE to Output Disabled
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
3) Refer to fmax Descriptions section. Characterized but not 100% tested.
4) Characterized but not 100% tested.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
UNITS
pF
TEST CONDITIONS
VCC = 5.0V, VI = 2.0V
VCC = 5.0V, VI/O = 2.0V
CI
8
8
CI/O
pF
*Characterized but not 100% tested.
11
LATTICE [ LATTICE SEMICONDUCTOR ]
