Specifications GAL16V8D/883
AC Switching Characteristics
Over Recommended Operating Conditions
-15
-20
-30
TEST
DESCRIPTION
PARAMETER
UNITS
COND1.
MIN. MAX. MIN. MAX. MIN. MAX.
tpd
tco
tcf2
tsu
th
A
A
Input or I/O to Combinational Output
Clock to Output Delay
3
2
15
12
12
—
3
2
20
15
15
—
3
2
30
20
20
—
ns
ns
ns
ns
—
—
Clock to Feedback Delay
—
12
—
15
—
25
Setup Time, Input or Feedback before Clock↑
Hold Time, Input or Feedback after Clock↑
—
A
0
—
—
0
—
—
0
—
—
ns
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
41.6
33.3
22.2
MHz
fmax3
A
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
41.6
50
—
—
33.3
41.6
—
—
22.2
33.3
—
—
MHz
MHz
Maximum Clock Frequency with
No Feedback
twh
twl
—
—
Clock Pulse Duration, High
Clock Pulse Duration, Low
10
10
—
—
12
12
—
—
15
15
—
—
ns
ns
ten
B
B
Input or I/O to Output Enabled
OE to Output Enabled
—
—
15
15
—
—
20
18
—
—
30
25
ns
ns
tdis
C
C
Input or I/O to Output Disabled
OE to Output Disabled
—
—
15
15
—
—
20
18
—
—
30
25
ns
ns
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
3) Refer to fmax Descriptions section.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
UNITS
pF
TEST CONDITIONS
VCC = 5.0V, VI = 2.0V
VCC = 5.0V, VI/O = 2.0V
CI
10
10
CI/O
pF
*Characterized but not 100% tested.
5
LATTICE [ LATTICE SEMICONDUCTOR ]
