Specifications
GAL16V8D/883
Absolute Maximum Ratings
(1)
Supply voltage V
CC
...................................... –0.5 to +7V
Input voltage applied .......................... –2.5 to V
CC
+1.0V
Off-state output voltage applied ......... –2.5 to V
CC
+1.0V
Storage Temperature ................................ –65 to 150°C
Case Temperature with
Power Applied ........................................ –55 to 125°C
1.Stresses above those listed under the “Absolute Maximum Rat-
ings” may cause permanent damage to the device. These are
stress only ratings and functional operation of the device at these
or at any other conditions above those indicated in the operational
sections of this specification is not implied (while programming,
follow the programming specifications).
Recommended Operating Conditions
Case Temperature (T
C
) .............................. –55 to 125°C
Supply voltage (V
CC
)
with Respect to Ground ..................... +4.50 to +5.50V
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL
PARAMETER
Input Low Voltage
Input High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
Output Low Voltage
Output High Voltage
Low Level Output Current
High Level Output Current
Output Short Circuit Current
Operating Power
Supply Current
V
CC
= 5V
V
OUT
= 0.5V T
A
= 25°C
L -15/ -20/-30
0V
≤
V
IN
≤
V
IL
(MAX.)
3.5V
≤
V
IN
≤
V
CC
I
OL
= MAX.
Vin
=
V
IL
or
V
IH
I
OH
= MAX.
Vin
=
V
IL
or
V
IH
CONDITION
MIN.
Vss – 0.5
TYP.
2
—
—
—
—
—
—
—
—
—
75
MAX.
0.8
Vcc+1
UNITS
V
V
µA
µA
V
V
mA
mA
mA
mA
V
IL
V
IH
I
IL
I
IH
V
OL
V
OH
I
OL
I
OH
I
OS
1
I
CC
2.0
—
—
—
2.4
—
—
–30
—
–
10
10
0.5
—
12
–2
–150
130
V
IL
= 0.5V
V
IH
= 3.0V
f
toggle
= 15MHz Outputs Open
1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester
ground degradation. Characterized but not 100% tested.
3) Typical values are at Vcc = 5V and T
A
= 25
°C
4
LATTICE [ LATTICE SEMICONDUCTOR ]
