Specifications GAL16LV8C
AC Switching Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
COM
COM
COM
-15
-7
-10
TEST
DESCRIPTION
PARAMETER
UNITS
COND1.
MIN. MAX.
MIN. MAX.
MIN. MAX.
tpd2
tco2
tcf3
tsu
th
A
A
Input or I/O to Combinational Output
Clock to Output Delay
1
1
7.5
5
1
1
10
7
1
1
15
10
8
ns
ns
ns
ns
—
—
Clock to Feedback Delay
—
6
4
—
7
5
—
12
Setup Time, Input or Feedback before Clock↑
Hold Time, Input or Feedback after Clock↑
—
—
—
—
A
0
—
—
0
—
—
0
—
—
ns
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
90.9
71.4
45.5
MHz
fmax4
A
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
100
100
—
—
83.3
83.3
—
—
50
—
—
MHz
MHz
Maximum Clock Frequency with
No Feedback
62.5
twh
twl
—
—
Clock Pulse Duration, High
Clock Pulse Duration, Low
5
5
—
—
6
6
—
—
8
8
—
—
ns
ns
ten
B
B
Input or I/O to Output Enabled
OE to Output Enabled
—
—
9
6
—
—
10
8
—
—
15
15
ns
ns
tdis
C
C
Input or I/O to Output Disabled
OE to Output Disabled
—
—
9
6
—
—
10
8
—
—
15
15
ns
ns
1) Refer to Switching Test Conditions section.
2) Minimum values for tpd and tco are not 100% tested but established by characterization.
3) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
4) Refer to fmax Descriptions section. Characterized but not 100% tested.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
Input Capacitance
I/O Capacitance
TYPICAL
UNITS
pF
TEST CONDITIONS
VCC = 3.3V, VI = 0V
VCC = 3.3V, VI/O = 0V
CI
8
8
CI/O
pF
13
LATTICE [ LATTICE SEMICONDUCTOR ]
