SPM0423HD4H-WB
14. RELIABILITY SPECIFICATIONS
Test
Description
100 cycles air-to-air thermal shock from -40oC to +125oC with 15
minute soaks. (IEC 68-2-4)
Thermal Shock
High Temperature Storage
Low Temperature Storage
High Temperature Bias
Low Temperature Bias
1,000 hours at +105oC environment (IEC 68-2-2 Test Ba)
1,000 hours at -40oC environment (IEC 68-2-2 Test Aa)
1,000 hours at +105oC under bias (IEC 68-2-2 Test Ba)
1,000 hours at -40oC under bias (IEC 68-2-2 Test Aa)
Temperature / Humidity Bias 1,000 hours at +85oC/85% R.H. under bias. (JESD22-A101A-B)
4 cycles of 20 to 2,000 Hz sinusoidal sweep with 20 G peak
acceleration lasting 12 minutes in X, Y, and Z directions.
(Mil-Std-883E, method 2007.2 A)
Vibration
ESD-HBM
3 discharges of ±2 kV direct contact to I/O pins. (ESD STM5.2)
3 discharges of ±8 kV direct contact to lid while unit is grounded.
(IEC 61000-4-2)
ESD-LID/GND
3 discharges of ±2 kV direct contact to I/O pins.
(MIL 883E, Method 3015.7)
ESD-MM
Reflow
5 reflow cycles with peak temperature of +260oC
Mechanical Shock
3 pulses of 10,000 G in the X, Y, and Z direction (IEC 68-2-27, Test Ea)
Note: After reliability tests are performed, the sensitivity of the microphones shall not deviate
more than 3 dB from its initial value.
Revision: C
Sheet 12 of 13
2/28/2013
©2013 Knowles Electronics
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