03 | Keysight | W2302 Advanced Design System Transient Convolution Element and W2500 Transient Convolution - Brochure
W2302EP/ET Transient Convolution Element
The Transient Convolution Element includes:
– Industry’s fastest SPICE simulator.
– A convolution capability that lets you bring components specified by S-
parameters in the frequency domain into a time domain simulation. Proven
algorithms ensure passivity and causality control. This is especially impor-
tant for challenging structures such a long or lossy transmission lines.
– Channel Simulator and Fast Eye Probe features, which allow interactive eye
diagram analysis of the transceiver and channel circuitry at million-bit-per-
minute simulation rates: about a thousand times faster than conventional
SPICE analysis.
– IBIS I/O models, which allow you to incorporate “executable datasheets”
from your semiconductor vendors models.
– A Signal integrity verification toolkit, which lets you perform jitter decom-
position using the same, tested EZJIT Plus algorithm used in Keysight’s test
and measurement instruments.
– The Broadband SPICE Model Generator for converting measured or simu-
lated S-parameter models to lumped equivalent or pole-zero representa-
tions.
Figure 2. Channel Simulator and Fast Eye Probe provides megabit eye measurements quickly and
accurately.
The Transient Convolution Element is unique in that it is not simply a high per-
formance point tool but a set of capabilities integrated into the most complete
serial link analysis platform, ADS. With the ADS platform you can move seam-
lessly between levels of abstraction--system-, circuit-, or physical-level–ac-
cording to the task at hand.
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