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W2312EP 参数 Datasheet PDF下载

W2312EP图片预览
型号: W2312EP
PDF下载: 下载PDF文件 查看货源
内容描述: [Keysight EEsof EDA]
分类和应用:
文件页数/大小: 6 页 / 1165 K
品牌: KEYSIGHT [ Keysight Technologies ]
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Introduction  
Figure 1. Eye diagram results from the ADS Transient-Convolution Simulator show excellent  
correlation with measurements, enabling rapid “what if” design space exploration.  
The Keysight EEsof EDA—the technology and innovation leader in high-speed,  
high-frequency electronic design automation—takes SPICE to a new level with  
the ADS Transient Convolution Element. This simulator is the industry’s fastest  
signal integrity circuit simulator for multigigabit, high-speed data link design.  
Multicore processor support and a new, high-capacity sparse matrix solver  
achieves a three-fold simulation speed improvement for signal integrity simula-  
tions.  
Design and verification of chip-to-chip multigigabit/s serial links is the morst  
common application for the Transient Convolution Element. At the very high  
data rates at which these links operate, signal integrity engineers must take into  
account physical phenomena such as impedance mismatch, reflections, elec-  
tromagnetic coupling, crosstalk and microwave frequency attenuation due to  
the skin effect and dielectric loss tangent. The simulator allows signal integrity  
engineers to perform “what-if” design space exploration using a circuit-level  
model that can be verified against measured data, and electromagnetic simula-  
tion on the post-layout artwork to arrive at an optimum design while avoiding  
costly and time consuming prototype iterations.