03 | Keysight | U7246A and U7246B SD UHS-I Card Compliance Test Application - Data Sheet
Configurability and
Guided Connection
The SD UHS-I card compliance test
application provides flexibility in your test
setup. The SD UHS-I card compliance test
application provides you with user-defined
controls for critical test parameters such
as sampling rate, number of acquisition
points used for analysis and customizable
violation settings. Once you have
configured the tests, the connection page
will display the connection diagram for the
test you have selected. With the multiple
test trial capability, you can extensively
characterize the performance of your
SD UHS-I card devices. You can run the
selected tests until the stop condition is
met. The application will then save the
worst-case conditions and help you track
down the anomalies in your signals.
Figure 2. The software provides user-defined controls for test parameters such as
sampling rate.
In addition to providing you with
measurement results, the SD USH-1 card
compliance test application reports how
close you are to the specified limit. You
can specify the level at which warnings are
to be issued. You are provided with a full
array of statistics for each measurement,
and you can save worst-case conditions to
extensively test the performance of your
device.
Figure 3. The SD UHS-I test application documents your test parameters, pass or fail
status, test specification range, measured values and pass/fail margin.