02 | Keysight | U7246A and U7246B SD UHS-I Card Compliance Test Application - Data Sheet
Features
The SD UHS-I card compliance test
application offers several features to
simplify the validation of your SD UHS-I
card designs:
– Setup wizard for quick setup,
configuration and test
– User-selected tests and configurations
based on SD version 3.0 specifications
and Test Spec for Card Ver3.00
– Integrated DUT control capability
to provide read-write burst signal
separation on the same bus in
real-time mode, allowing a precise
waveform capture as defined in SD
UHS-I card compliance condition
– Test framework provides powerful
characterization through multiple
trials that show a full array of
statistics for each measurement and
returns the worst measurement value
Figure 1. The Keysight automated test engine filters the test selection based on your test setup.
You can easily select individual tests or groups of tests with a mouse-click.
The Keysight Technologies, Inc. SD UHS-I
card compliance test application provides
a fast and easy way to test, debug and
characterize your SD UHS-I card designs.
The tests performed by the SD UHS-I
compliance test software are based on
the SD 1 version 3.0 specifications and
Test Spec for Card Ver3.00. The test
application offers a user-friendly setup
wizard and a comprehensive report that
includes margin analysis.
Comprehensive Test Coverage
With the SD UHS-I card compliance test application, you can use the same oscilloscope
you use for everyday debugging to perform automated testing and margin analysis based
on the SD timing and current consumption specifications. The application automatically
configures the oscilloscope for each test and provides informative results. It includes
margin analysis indicating how close your device comes to passing or failing the test
for each specification. Some of the difficulties in performing the compliance tests are
connecting to the target device, configuring the oscilloscope, performing the tests and
analyzing the measured results. The SD UHS-I card compliance test application does
most of this work for you by using the automated test engine platform with the integrated
DUT control capability 2.
The next-generation SDXC memory card
specification with increased bus interface
of UHS-I speeds up to 104 MB per
second or higher, dramatically improves
consumers’ digital lifestyles by increasing
storage capacity to 2 TB. The compliance
test offers bus timing analysis on the
command and data lines with eye diagram
measurements for all UHS-I speed modes
including Default and High speed mode.
The compliance test also covers current
consumption tests for all UHS-I speed
modes including Default and High speed
mode. The SD UHS-I card compliance
test application is compatible with
Easy Test Definition
The test application enhances the usability of Keysight Infiniium oscilloscopes for testing
SD UHS-I card devices. The Keysight automated test framework guides you quickly
through the steps required to define the setup, perform the tests and view the test
results. You can select a category of tests or specify individual tests. The user interface
is designed to minimize unnecessary reconnections, which saves time and minimizes
potential operator error. You can save the tests and configurations as project files and
recall them later for quick testing and review of previous results. Clear menus let you
perform tests with minimum mouse clicks.
Keysight Infiniium 9000 and 90000 Series
oscilloscopes.
1. The SD (Secure Digital) is a set of industry standards and promotes Secure Digital (SD) product
acceptance in a variety of applications.
2. Integrated DUT Control capability is provided by Tokyo Electron Devices’s SD Host Emulator board.
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