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U4164A-004 参数 Datasheet PDF下载

U4164A-004图片预览
型号: U4164A-004
PDF下载: 下载PDF文件 查看货源
内容描述: [Logic Analyzer Module]
分类和应用:
文件页数/大小: 34 页 / 1843 K
品牌: KEYSIGHT [ Keysight Technologies ]
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13 | Keysight | U4164A Logic Analyzer Module - Data Sheet  
Signal Integrity Insight Made Fast and Easy  
As timing and voltage margins continue to shrink, confidence in signal integrity becomes  
an increasingly vital requirement in the design validation process. Eye scan lets you acquire  
qualitative signal integrity information in a matter of minutes on all the buses in your design  
under a wide variety of operating conditions.  
– Identify problem signals quickly for further investigation with an oscilloscope.  
– Results can be viewed for each individual signal or as a composite of multiple signals or  
buses.  
The ability to qualify scans of any signal from any combination of other signals, full triggering  
capabilities for scan qualification, and customizable viewing windows allow you to sample  
only when the qualifying signal is active and see specific system activity of interest. Eye scan  
technology in the U4154B provides insights that can’t be achieved as easily with any other test  
method. DDR eye scan automatically groups signals so you can quickly spot byte lane related  
signal integrity problems. Scans can be qualified based on state trigger criteria, providing  
unique insight. For example, read and write scans can be separated. Signal trace mode scan  
allows you to gather signal integrity information on two read or write cycles separated by only  
one cycle.  
DDR eye scan is available at no charge as part of the Keysight B4661A memory analysis  
software package that can be downloaded from:  
www.keysight.com/find/B4661A  
Figure 7 shows a scan using signal trace mode where the samples in a DDR/LPDDR data  
burst are displayed in sequence. Figure 8 shows DDR3 DQ (data bits) scanned in overlay mode  
where the samples in the burst are scanned so that they overlay. Overlay mode provides the  
worst case eye, which allows for the most accurate sample position for the state mode sample  
positions.  
Figure 7. Burst qualified eye scan allows you to view the activity on the signals only when a burst is taking  
place. The screenshot above shows DDR4 2400 Mb/s read DQS 0-3 scanned in signal trace mode with no  
back-to-back bursts, allowing the user to view the DDR4 read strobes relative to each other, including the  
strobe pre-embles.  
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