40 | Keysight | Infiniium Z-Series Oscilloscopes - Data Sheet
Specifications (Continued)
Hardware trigger (Continued)
Maximum measurement update rate
> 50,000 measurement/sec (one measurement turned on)
> 250,000 measurement/sec/measurement (ten measurements turned on)
Standard, Measure all edges mode
Measurement modes
Waveform measurements
Voltage
Peak to peak, minimum, maximum, average, RMS, amplitude, base, top, overshoot, preshoot, upper, middle,
lower, Vovershoot, Vtime, Vpreshoot, crossing, pulse base, pulse amplitude, pulse top, PAM level mean 2,
PAM level RMS 2, PAM level skew 2, PAM level thickness 2
Time
Rise time, fall time, positive width, negative width, burst width, burst period, burst interval, Tmin, Tmax,
Tvolt, + pulse count, - pulse count
Clock
Period, frequency, duty cycle to duty cycle, phase, N-period
Data
Setup time, hold time
Mixed
Area, slew rate
Frequency domain
Level qualification
Eye-diagram measurements
Jitter analysis measurements
Clock
FFT frequency, FFT magnitude, FFT delta frequency, FFT delta magnitude, peak detect mode
Any channels that are not involved in a measurement can be used to level-qualify all timing measurements
Eye height, eye width, eye jitter, crossing percentage, Q factor, and duty-cycle distortion
Requires Option 002 (or E2681A), 004 (N5400A), or 070 (N8823A). Standard on DSA Series
Time interval error, N-period, period to period, positive width to positive width, neg width to neg width, and
duty cycle to duty cycle
Data
Statistics
Time interval error, unit interval, N Unit Interval, unit interval to unit interval, data rate, CDR, de-emphasis
Displays the current, mean, minimum, maximum, range (max-min), standard deviation, number of
measurements value for the displayed automatic measurements
Histograms
Source
Waveform or measurement
Orientation
Vertical (for timing and jitter measurements) or horizontal (noise and amplitude change) modes, regions are
defined using waveform markers
Measurements (available as a function)
Mask testing
Mean, standard deviation, mean ± 1, 2, and 3 sigma, median, mode, peak-to-peak, min, max, total hits,
peak (area of most hits), X scale hits, and X offset hits
Allows pass/fail testing to user-defined or Keysight-supplied waveform templates. Automask lets you
create a mask template from a captured waveform and define a tolerance range in time/voltage or screen
divisions. Test modes (run until) include test forever, test to specified time or event limit, and stop on
failure. Executes “multipurpose” user setting on failure
“Unfold real-time eye” feature allows individual bit errors to be observed by unfolding a real-time eye when
clock recovery is on
Communications mask test kit option provides a set of ITU-T G.703, ANSI T1.102, and IEEE 802.3 industry-
standard masks for compliance testing
Waveform math
Number of functions
Sixteen
Hardware accelerated math operations
Differential and Common Mode
Absolute value, add, amplitude demodulation (radar envelope), average, Butterworth 1, common mode,
delay, differentiate, divide, FFT magnitude, FFT, phase, FIR 1, high pass filter, histogram, horizontal gating,
integrate, invert, LFE 1, low pass filter (4th-order Bessel Thompson filter), magnify, max, measurement
trend, min, multiply, RT Eye 1, smoothing, SqrtSumOfSquare 1, square, square root, subtract, versus, and
optional user defined function (Option 010)
FFT
Frequency range
Frequency resolution
Window modes
DC to 80 GHz (at 160 GSa/s) or 40 GHz (at 80 GSa/s) or 20 GHz (at 40 GSa/s)
Sample rate/memory depth = resolution
Hanning, flattop, rectangular, Blackman-Harris, Hamming
1. Requires EZJIT Plus (Option N5400A) or EZJIT Complete (Option N8823A) software.
2. Requires PAM-4 analysis (Option N8827A) software.
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