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M9195A 参数 Datasheet PDF下载

M9195A图片预览
型号: M9195A
PDF下载: 下载PDF文件 查看货源
内容描述: [M9195A PXIe Digital Stimulus/Response with PMU: 250 MHz, 16-channel]
分类和应用:
文件页数/大小: 19 页 / 3790 K
品牌: KEYSIGHT [ Keysight Technologies ]
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05 | Keysight | M9195A PXIe Digital Stimulus/Response with PMU: 250 MHz, 16-channel - Data Sheet  
Comprehensive software tool set  
Keysight offers a choice of drivers and programming environments to configure and con-  
trol the PXI DSR during test development including:  
– Full featured, high-level IVI-COM, IVI-C, LabVIEW programming interfaces through  
drivers  
– IEEE-1450/ STIL, OpenXML (Excel), or text file format for programmatically defining  
patterns  
– The M9195A Soft Front Panel for interactive test control and debug  
These test development tools can be used in powerful combinations to match the DUT’s  
test flow and test requirements.  
Soft Front Panel (SFP)  
The SFP assists the user in the development and application of test patterns, allows the  
user to change key test execution parameters, and allows the user to validate and com-  
pensate for test fixture connectivity. During pattern development, the user interactively  
loads and execute STIL, XML, or bulk data files. When loading, the tests are checked  
for correct syntax and the SFP generates error messages to help debug patterns. The  
SFP enables the user to the control various execution and response logging modes. In  
addition to these features, the SFP uses the same IVI interface driver calls. Each function  
initiated by the SFP logs an example driver call that can then be used in a regular API  
environment.  
IVI and LabVIEW drivers  
The IVI driver set can be used to fully control all aspects of test development using the  
DSR from assigning hardware pins to creating and executing waveform patterns using  
the M9195A. The drivers include high level commands for:  
– Initial configuration including pin/channel names assignments, signal direction,  
grouping pins/channels to make vector definition easier.  
– Setting physical layer conditions such as voltage levels, active loads  
– Defining single or multisite configurations.  
– Pattern definition and waveform timing.  
– Pattern sequencing