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CX1203A 参数 Datasheet PDF下载

CX1203A图片预览
型号: CX1203A
PDF下载: 下载PDF文件 查看货源
内容描述: [Device Current Waveform Analyzer]
分类和应用:
文件页数/大小: 32 页 / 4519 K
品牌: KEYSIGHT [ Keysight Technologies ]
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03 | Keysight | CX3300 Series Device Current Waveform Analyzer - Data Sheet  
Greater demand for transient current measurements  
Researchers working on advanced semiconductor or non-volatile memory devices  
such as ReRAM and PRAM are struggling to observe the behavior of newly developed  
materials when a short voltage pulse (< 100 ns) is applied. Since the transient current  
ranges from sub-nA to over mA, it is very difficult to clearly detect entire transient  
current behavior.  
Greater demand for power and current reduction  
Engineers working on battery-powered device development are under greater pressure  
to obtain a reduction in power and current consumption. As the recent technology trend  
in low power IoT, M2M, wearables, etc. has significantly accelerated this pressure, there  
is a need to reduce more unused power from existing devices. As a result, engineers are  
forced to look into even component level dynamic current consumption, which is always  
very difficult to measure especially for low-power devices used in IoT enabled products.  
What makes wideband low-level current waveform measure-  
ments so difficult?  
1. Limited dynamic range  
Time  
For example, most of the battery-powered devices have low power status such as “sleep  
state” or “standby state” that consume very little supply current such as less than 1  
μA, while the “active state” usually requires more than 10 mA current. It is difficult to  
measure such a wide dynamic range of currents with a single measurement.  
Figure 1. Current waveform measurements:  
limited dynamic range, large measurement noise  
and limited bandwidth  
2. Large measurement noise  
Wide  
bandwidth  
High speed  
sampling  
Clamp-on type current probes are widely used, but measuring low-level current less  
than 1 mA is always difficult due to the large noise floor. Using a shunt resistor and an  
oscilloscope is very useful, but the minimum measurable current is limited due to the  
noise floor and the voltage drop across the resistor.  
3. Limited bandwidth  
Low-level current waveform measurements with a certain level of resolution need a  
tradeoff with bandwidth, otherwise wideband measurements may degrade the resolu-  
tion. Using a multimeter or an ammeter is popular for high resolution measurements, but  
not appropriate for wideband current measurements due to the lesser bandwidth. It is  
also difficult to measure multiple ranges with the same wide bandwidth when you use a  
custom measurement instrument built using standard rather than specialist parts.  
Time  
Wide  
dynamic  
range  
Low  
noise  
floor  
4. Multiple instruments required  
Figure 2. Expected key requirements for wide-  
band low-level current waveform measurements.  
A multimeter is commonly used to measure the averaged “sleep state” current, while  
the “active state” current can be captured using an oscilloscope. The total power and  
current consumptions must be manually estimated from these results, but the data is not  
always reliable and it can be time consuming to validate it.  
As shown in Figure 2, engineers and researchers need a wideband low-level current  
waveform measurement solution with a single instrument, simultaneously meeting  
multiple key measurement requirements.  
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