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AS7C332MNTD18A-167TQIN 参数 Datasheet PDF下载

AS7C332MNTD18A-167TQIN图片预览
型号: AS7C332MNTD18A-167TQIN
PDF下载: 下载PDF文件 查看货源
内容描述: [ZBT SRAM, 2MX18, 7.5ns, CMOS, PQFP100, 14 X 20 MM, LEAD FREE, TQFP-100]
分类和应用: 静态存储器内存集成电路
文件页数/大小: 22 页 / 452 K
品牌: ISSI [ INTEGRATED SILICON SOLUTION, INC ]
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AS7C332MNTD18A  
®
Scan register sizes  
Register name  
Instruction  
Bypass  
Bit size  
3
1
ID  
32  
Boundary scan  
x18:76  
Instruction codes  
Instruction  
Code  
Description  
Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Forces all  
SRAM outputs to High-Z state. This instruction is not 1149.1-compliant.  
EXTEST  
IDCODE  
000  
001  
Loads the ID register with the vendor ID code and places the register between TDI and TDO.  
This operation does not affect SRAM operations.  
Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Forces all  
SRAM output drivers to a high-Z state.  
SAMPLE Z  
RESERVED  
010  
101  
100  
Do not use. This instruction is reserved for future use.  
SAMPLE/  
PRELOAD  
Captures I/O ring contents. Places the boundary scan register between TDI and TDO.  
Places the bypass register between TDI and TDO. This operation does not affect SRAM  
operations.  
BYPASS  
111, 011, 110  
4/26/04, V 1.2  
Alliance Semiconductor  
P. 15 of 22  
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