HIGH TEMPERATURE GATE BIAS (HTGB)
Junction Temperature:
Tj = as specified below
Vc = Ve = 0V
Vg = as specified
N Channel
DEVICE
TYPE
DATE
CODE
TEMP
GATE
BIAS
(V)
20
20
QTY
MID FREQUENCY ( Fast )
FAILURES
ACTUAL
TEST
TIME
#
MODE
(hours)
(note b)
20
2007 0
20
2088 0
40
4095 0
DEV-HRS
@ 90°C
FAILURE RATE @
90°C & 60% UCL
FITs
(note a)
2.46E+05
2.56E+05
5.02E+05
3724
3579
1825
IRGPF30F
IRGPC50FD2
(deg C)
9642
150
9237
150
TOTALS
N Channel
DEVICE
TYPE
DATE
CODE
TEMP
GATE
BIAS
(V)
20
20
20
20
QTY
HIGH FREQUENCY ( Ultra-Fast )
ACTUAL
TEST
TIME
(hours)
2008
2008
2213
2039
EQUIVALENT FAILURE RATE @
FAILURES
DEV-HRS 90°C & 60% UCL
@ 90°C
MODE
FITs
(note b)
(note a)
2.46E+05
3722
2.46E+05
3722
2.71E+05
3377
2.50E+05
3665
1.01E+06
904
#
0
0
0
0
IRGPC40U
IRGPC40U
IRG4PC50U
IRG4PC40UD2
9538
9620
9721
9643
(deg C)
150
150
150
150
20
20
20
20
80
TOTALS
8268 0
NOTES
a.
b.
One FIT represents one failure in one billion (1.0E+09) hours.
FAILURE MODES:
IGBT / CoPack
Quarterly Reliability Report
Page 12 of 35
IRF [ INTERNATIONAL RECTIFIER ]
