DG408, DG409
Test Circuits and Waveforms
+15V
+15V
V+
+2.4V
+2.4V
V+
±10V
±10V
S
S
EN
EN
1
7
1B
A
A
A
A
S
- S
S
- S
4A,
D
0
1
2
2
1A
DG409
SWITCH
SWITCH
OUTPUT
V
O
±
±
LOGIC
INPUT
LOGIC
INPUT
DG408
10V
S
A
S
10V
8
0
4B
OUTPUT
V
D
D
B
A
O
1
GND V-
GND V-
50Ω
300Ω
35pF
50Ω
300Ω
35pF
-15V
-15V
FIGURE 1A. DG408 TEST CIRCUIT
FIGURE 1B. DG409 TEST CIRCUIT
t < 20ns
r
t < 20ns
f
3V
0V
LOGIC
INPUT
50%
50%
S
ON
1
V
S1
0.8 V
SWITCH
OUTPUT
S1
0V
V
O
0.8 V
S8
V
S8
t
t
TRANS
TRANS
S
ON
8
FIGURE 1C. MEASUREMENT POINTS
FIGURE 1. TRANSITION TIME
+15V
V+
+15V
V+
A
S
A
S
0
1
-5V
0
1B
4A
A
B
-5V
DG408
DG409
A
A
A
1
1
2
SWITCH
LOGIC
SWITCH
OUTPUT
S
- S
S
- S
2
8
1A
LOGIC
INPUT
S
S
D
D
OUTPUT
2B - 4B,
V
INPUT
V
IN
IN
D
V
V
EN
EN
GND V-
O
o
GND V-
50Ω
300Ω
35pF
50Ω
300Ω
35pF
-15V
-15V
FIGURE 2A. DG408 TEST CIRCUIT
FIGURE 2B. DG409 TEST CIRCUIT
t < 20ns
r
t < 20ns
f
3V
LOGIC
INPUT
50%
50%
0V
V
IN
t
ON(EN)
0V
SWITCH
OUTPUT
V
O
0.9 V
O
V
O
t
OFF(EN)
FIGURE 2C. MEASUREMENT POINTS
FIGURE 2. ENABLE SWITCHING TIMES
FN3283.8
June 13, 2006
6
INTERSIL [ Intersil ]
