Specifications CD4060BMS
TABLE 6. APPLICABLE SUBGROUPS (Continued)
MIL-STD-883
CONFORMANCE GROUP
METHOD
GROUP A SUBGROUPS
READ AND RECORD
READ AND RECORD
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
TEST
MIL-STD-883
METHOD
CONFORMANCE GROUPS
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
1, 9
POST-IRRAD
Table 4
Group E Subgroup 2
5005
1, 7, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
16
9V ± -0.5V
50kHz
25kHz
Static Burn-In 1 Note 1 1 - 7, 9, 10, 13 - 15
Static Burn-In 2 Note 1 1 - 7, 9, 10, 13 - 15
8, 11, 12
8
8, 12
8
11, 12, 16
16
Dynamic Burn-In Note 1
Irradiation Note 2
NOTES:
-
1 - 7, 9, 10, 13 - 15
11
-
1 - 7, 9, 10, 13 - 15
11, 12, 16
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V ±
0.5V
Logic Diagram
*
ø 0
9
*
*
ø1 Q1
FF1
ø2
ø2
Q13
FF2-FF13
Q13
ø14 Q14
FF14
10
11
ø 0
ø I
***
ø1 Q1
ø14 Q14
Q14
**
*
12
RESET
Q4 - Q10
Q12, Q13
**R = HIGH DOMINATES (RESETS ALL STAGES)
VDD
VSS
*ALL INPUTS ARE PROTECTED
BY CMOS PROTECTION
NETWORK
***COUNTER ADVANCES ONE BINARY COUNT
ON EACH NEGATIVE - GOING TRANSITION
OF øI (AND øO)
DETAIL OF TYPICAL FLIP-FLOP STAGE
ø
ø
p
p
Q
R
n
ø
n
ø
R
ø
p
ø
p
Q
n
ø
n
ø
7-954
INTERSIL [ Intersil ]
