Specifications CD4043BMS, CD4044BMS
TABLE 6. APPLICABLE SUBGROUPS
MIL-STD-883
CONFORMANCE GROUP
Initial Test (Pre Burn-In)
Interim Test 1 (Post Burn-In)
Interim Test 2 (Post Burn-In)
PDA (Note 1)
METHOD
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
Sample 5005
Sample 5005
Sample 5005
Sample 5005
GROUP A SUBGROUPS
READ AND RECORD
IDD, IOL5, IOH5A
1, 7, 9
1, 7, 9
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
1, 7, 9
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
PDA (Note 1)
1, 7, 9
IDD, IOL5, IOH5A
1, 7, 9, Deltas
Final Test
2, 3, 8A, 8B, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 7, 9
Group A
Group B
Subgroup B-5
Subgroup B-6
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
Group D
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
TEST
READ AND RECORD
MIL-STD-883
METHOD
CONFORMANCE GROUPS
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
PART NUMBER CD4043BMS
Static Burn-In 1
Note 1
1, 2, 9, 10, 13
1, 2, 9, 10, 13
13
3 - 8, 11, 12, 14,
15
16
Static Burn-In 2
Note 1
8
8
8
3 - 7, 11, 12,
14 - 16
Dynamic Burn-
In Note 1
5, 16
1, 2, 9, 12
4, 6, 12, 14
3, 7, 11, 15
Irradiation
Note 2
1, 2, 9, 10, 13
3 - 7, 11, 12,
14 - 16
PART NUMBER CD4044BMS
Static Burn-In 1
Note 1
1, 2, 9, 10, 13
1, 2, 9, 10, 13
2
3 - 8, 11, 12, 14,
15
16
Static Burn-In 2
Note 1
8
8
8
3 - 7, 11, 12,
14 - 16
Dynamic Burn-
In Note 1
5, 16
1, 9, 10, 13
4, 6, 12, 14
3, 7, 11, 15
Irradiation
Note 2
1, 2, 9, 10, 13
3 - 7, 11, 12,
14 - 16
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD
= 10V ± 0.5V
7-880
INTERSIL [ Intersil ]
