Electrical Specifications
maximum allowable overshoot above VID). These specifications apply to the processor
die voltage as measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands and
across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands.
Table 2-17. VCC Overshoot Specifications
Symbol
Parameter
Magnitude of V overshoot above VID
Min
Max
Units
Figure
Notes
V
50
25
mV
µs
2-5
2-5
OS_MAX
CC
T
Time duration of V overshoot above VID
CC
OS_MAX
Figure 2-5. VCC Overshoot Example Waveform
Example Overshoot Waveform
VOS
VID + 0.050
VID - 0.000
TOS
0
5
10
15
20
25
Time [us]
TOS: Overshoot time above VID
OS: Overshoot above VID
V
Notes:
1.
2.
V
is the measured overshoot voltage above VID.
is the measured time duration above VID.
OS
OS
T
2.12.2
Die Voltage Validation
Core voltage (VCC) overshoot events at the processor must meet the specifications in
Table 2-17 when measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands
and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Overshoot events that
are < 10 ns in duration may be ignored. These measurement of processor die level
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
§
32
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
INTEL [ INTEL ]
