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XC2000 参数 Datasheet PDF下载

XC2000图片预览
型号: XC2000
PDF下载: 下载PDF文件 查看货源
内容描述: 16位/ 32位单芯片微控制器与32位性能 [16/32-Bit Single-Chip Microcontroller with 32-Bit Performance]
分类和应用: 微控制器
文件页数/大小: 110 页 / 2339 K
品牌: INFINEON [ Infineon ]
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XC2287 / XC2286 / XC2285  
XC2000 Family Derivatives  
Preliminary  
Table 12  
Electrical Parameters  
DC Characteristics for 4.5 V VDDP 5.5 V (cont’d)  
(Operating Conditions apply)1)  
Parameter  
Symbol  
Values  
Unit Note /  
Test Condition  
Min.  
Typ.  
Max.  
±20  
10  
XTAL1 input current  
Pin capacitance9)  
IIL CC  
µA 0 V < VIN < VDDI  
CIO CC  
pF  
(digital inputs/outputs)  
1) Keeping signal levels within the limits specified in this table, ensures operation without overload conditions.  
For signal levels outside these specifications, also refer to the specification of the overload current IOV  
.
2) Overload conditions must not occur on pin XTAL1.  
3) Not subject to production test - verified by design/characterization. Hysteresis is implemented to avoid meta  
stable states and switching due to internal ground bounce. It cannot suppress switching due to external system  
noise under all conditions.  
4) The maximum deliverable output current of a port driver depends on the selected output driver mode, see  
Table 11, Current Limits for Port Output Drivers. The limit for pin groups must be respected.  
5) As a rule, with decreasing output current the output levels approach the respective supply level (VOLVSS,  
VOHVDDP). However, only the levels for nominal output currents are verified.  
6) This specification is not valid for outputs which are switched to open drain mode. In this case the respective  
output will float and the voltage results from the external circuitry.  
7) An additional error current (IINJ) will flow if an overload current flows through an adjacent pin. Please refer to  
the definition of the overload coupling factor KOV  
.
8) The given values are worst-case values. In the production test, this leakage current value is only tested at  
125°C, other values are ensured via correlation. For derating, please refer to the following descriptions:  
Leakage derating depending on temperature (TJ = junction temperature [°C]):  
I
OZ = 0.009 × e(0.054×TJ) [µA]. For example, at a temperature of 130°C the resulting leakage current is 10.07 µA.  
Leakage derating depending on voltage level (DV = VDDP - VPIN [V]):  
I
OZ = IOZtempmax - (1.6 × DV) [µA]  
The shown voltage derating formula is an approximation which applies for maximum temperature.  
Pin P2.8 is connected to two pads (additionally the high-speed clock pad), so it sees twice the normal leakage.  
9) Not subject to production test - verified by design/characterization.  
Pin P2.8 is connected to two pads (additionally the high-speed clock pad), so it sees twice the normal  
capacitance.  
Data Sheet  
78  
V0.91, 2007-02  
Draft Version  
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