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IKW75N60T 参数 Datasheet PDF下载

IKW75N60T图片预览
型号: IKW75N60T
PDF下载: 下载PDF文件 查看货源
内容描述: 低损耗DUOPACK : IGBT的沟槽场终止和技术,软,恢复快反平行EMCON何二极管 [Low Loss DuoPack : IGBT in Trench and Fieldstop technology with soft, fast recovery anti-parallel EmCon HE diode]
分类和应用: 二极管双极性晶体管
文件页数/大小: 13 页 / 411 K
品牌: INFINEON [ Infineon ]
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IKW75N60T  
q
TrenchStop Series  
Switching Characteristic, Inductive Load, at Tj=25 °C  
Value  
Unit  
Parameter  
Symbol  
Conditions  
min.  
typ.  
max.  
IGBT Characteristic  
Turn-on delay time  
Rise time  
Turn-off delay time  
Fall time  
Turn-on energy  
Turn-off energy  
Total switching energy  
Anti-Parallel Diode Characteristic  
Diode reverse recovery time  
Diode reverse recovery charge  
td(on)  
tr  
td(off)  
tf  
Eon  
Eoff  
Et s  
-
-
-
-
-
-
-
33  
36  
330  
35  
2.0  
2.5  
4.5  
-
-
-
-
-
-
-
ns  
Tj =25°C,  
V
V
CC =400V,IC =75A,  
G E=0/15V,  
RG=5,  
Lσ 1) =100nH,  
Cσ 1) =39pF  
mJ  
Energy losses include  
“tail” and diode  
reverse recovery.  
trr  
Qrr  
-
-
-
-
121  
2.4  
38.5  
921  
-
-
-
-
ns  
µC  
A
Tj =25°C,  
VR =400V, IF =75A,  
diF/dt=1460A/µs  
Diode peak reverse recovery current Irrm  
Diode peak rate of fall of reverse  
dirr /dt  
A/µs  
recovery current during tb  
Switching Characteristic, Inductive Load, at Tj=175 °C  
Value  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
IGBT Characteristic  
Turn-on delay time  
Rise time  
Turn-off delay time  
Fall time  
Turn-on energy  
Turn-off energy  
Total switching energy  
Anti-Parallel Diode Characteristic  
Diode reverse recovery time  
Diode reverse recovery charge  
td(on)  
tr  
td(off)  
tf  
Eon  
Eoff  
Et s  
-
-
-
-
-
-
-
32  
37  
363  
38  
2.9  
2.9  
5.8  
-
-
-
-
-
-
-
ns  
Tj =175°C,  
V
V
CC =400V,IC =75A,  
G E=0/15V,  
RG= 5Ω  
Lσ 1) =100nH,  
Cσ 1) =39pF  
mJ  
Energy losses include  
“tail” and diode  
reverse recovery.  
trr  
Qrr  
-
-
-
-
182  
5.8  
56.2  
1013  
-
-
-
-
ns  
µC  
A
Tj =175°C  
VR =400V, IF =75A,  
diF/dt=1460A/µs  
Diode peak reverse recovery current Irrm  
Diode peak rate of fall of reverse  
dirr /dt  
A/µs  
recovery current during tb  
1) Leakage inductance Lσ and Stray capacity Cσ due to dynamic test circuit in Figure E.  
3
Rev. 2.4 May 06  
Power Semiconductors