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IDT71024S12Y 参数 Datasheet PDF下载

IDT71024S12Y图片预览
型号: IDT71024S12Y
PDF下载: 下载PDF文件 查看货源
内容描述: CMOS静态RAM 1 MEG ( 128K ×8位) [CMOS STATIC RAM 1 MEG (128K x 8-BIT)]
分类和应用:
文件页数/大小: 8 页 / 72 K
品牌: IDT [ INTEGRATED DEVICE TECHNOLOGY ]
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IDT71024  
CMOS STATIC RAM 1MEG (128K x 8-BIT)  
MILITARY, INDUSTRIAL AND COMMERCIAL TEMPERATURE RANGES  
AC ELECTRICAL CHARACTERISTICS (VCC = 5.0V ± 10%, All Temperature Ranges)  
71024S12(1)  
71024S15  
71024S17(3) 71024S20 71024S25(2)  
Symbol Parameter  
Read Cycle  
Min. Max.  
Min. Max.  
Min.  
Max. Min. Max. Min. Max.  
Unit  
tRC  
tAA  
Read Cycle Time  
12  
3
12  
12  
6
15  
3
15  
15  
7
17  
3
17  
17  
8
20  
3
20  
20  
8
25  
3
25  
25  
10  
10  
10  
25  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address Access Time  
tACS  
Chip Select Access Time  
(4)  
tCLZ  
tCHZ  
tOE  
Chip Select to Output in Low-Z  
Chip Deselect to Output in High-Z  
Output Enable to Output Valid  
Output Enable to Output in Low-Z  
Output Disable to Output in High-Z  
Output Hold from Address Change  
Chip Select to Power-Up Time  
Chip Deselect to Power-Down Time  
(4)  
0
0
0
0
0
0
6
0
7
0
8
0
8
0
(4)  
tOLZ  
5
5
6
7
(4)  
tOHZ  
tOH  
0
0
0
0
0
4
12  
4
15  
4
17  
4
20  
4
(4)  
tPU  
tPD  
0
0
0
0
0
(4)  
Write Cycle  
tWC  
tAW  
tCW  
tAS  
Write Cycle Time  
12  
10  
10  
0
5
15  
12  
12  
0
5
17  
13  
13  
0
7
20  
15  
15  
0
8
25  
15  
15  
0
9
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address Valid to End-of-Write  
Chip Select to End-of-Write  
Address Set-up Time  
tWP  
tWR  
tDW  
tDH  
tOW  
Write Pulse Width  
10  
0
12  
0
13  
0
15  
0
15  
0
Write Recovery Time  
Data Valid to End-of-Write  
Data Hold Time  
7
8
9
9
10  
0
0
0
0
0
(4)  
Output Active from End-of-Write  
Write Enable to Output in High-Z  
3
3
3
4
4
(4)  
tWHZ  
0
0
0
0
0
ns  
NOTES:  
2964 tbl 010  
1. 0°C to +70°C temperature range only.  
2. –55°C to +125°C temperature range only.  
3. 0°C to +70°C and –55°C to +125°C temperature ranges only.  
4. This parameter guaranteed with the AC load (Figure 2) by device characterization, but is not production tested.  
5