IDT29FCT2052AT/BT/CT
FAST CMOS OCTAL REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
B
7
B
6
B
5
B
4
B
3
B
2
B
1
B
0
OEB
CPA
CEA
GND
1
2
3
4
5
6
7
8
9
10
11
12
SO24-2
SO24-8
24
23
22
21
20
19
18
17
16
15
14
13
V
CC
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
OEA
CPB
CEB
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
TERM
(2)
V
TERM
(3)
T
STG
I
OUT
Description
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND
Storage Temperature
DC Output Current
Max
–0.5 to +7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
CAPACITANCE
(T
A
= +25°C, F = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
6
8
Max.
10
12
Unit
pF
pF
NOTE:
1. This parameter is measured at characterization but not tested.
SOIC/ QSOP
TOP VIEW
REGISTER FUNCTION TABLE
(1)
(Applies to A or B Register)
D
X
L
H
Inputs
CP
X
↑
↑
CE
H
L
L
Internal
Q
NC
L
H
Function
Hold Data
Load Data
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
NC = No Change
↑
= LOW-to-HIGH Transition
OUTPUT CONTROL
(1)
Internal
OE
H
L
L
Q
X
L
H
Y-Outputs
Z
L
H
Function
Disable Outputs
Enable Outputs
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedance
2
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
