Integrated
Circuit
Systems, Inc.
ICS840002I
F
EMTO
C
LOCKS
™ C
RYSTAL
-
TO
-
LVCMOS/LVTTL F
REQUENCY
S
YNTHESIZER
T
ABLE
4C. LVCMOS/LVTTL DC C
HARACTERISTICS
,
V
DD
= V
DDA
= V
DDO
= 3.3V±5%
OR
2.5V±5%,
OR
V
DD
= V
DDA
= 3.3V±5%, V
DDO
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol Parameter
V
IH
V
IL
Input High Voltage
Input Low Voltage
OE
F_SEL0:1, nPLL_SEL, MR,
nXTAL_SEL, TEST_CLK
OE
F_SEL0:1, nPLL_SEL, MR,
nXTAL_SEL, TEST_CLK
Test Conditions
V
DD
= 3.465V
V
DD
= 2.625V
V
DD
= 3.465V
V
DD
= 2.625V
V
DD
= V
IN
= 3.465V
or 2.625V
V
DD
= V
IN
= 3.465V
or 2.625V
V
DD
= 3.465V or 2.625V,
V
IN
= 0V
V
DD
= 3.465V or 2.625V,
V
IN
= 0V
V
DDO
= 3.3V±5%
V
DDO
= 2.5V±5%
V
DDO
= 3.3V or 2.5V±5%
Minimum Typical
2
1.7
-0.3
-0.3
Maximum
V
DD
+ 0.3
V
DD
+ 0.3
0.8
0. 7
5
150
Units
V
V
V
V
µA
µA
µA
µA
V
V
I
IH
Input
High Current
I
IL
Input
Low Current
-150
-5
2.6
1.8
0.5
V
OH
V
OL
Output High Voltage; NOTE 1
Output Low Voltage; NOTE 1
V
NOTE 1: Outputs terminated with 50
Ω
to V
DDO
/2. See Parameter Measurement Information, Output Load Test Circuit.
T
ABLE
5. C
RYSTAL
C
HARACTERISTICS
Parameter
Mode of Oscillation
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
NOTE: Characterized using an 18pF parallel resonant crystal.
Test Conditions
Minimum
Typical
26.5625
50
7
Maximum
Units
MHz
Ω
pF
Fundamental
840002AGI
www.icst.com/products/hiperclocks.html
4
REV. A MARCH 10, 2005
ICS [ INTEGRATED CIRCUIT SYSTEMS ]
