Integrated
Circuit
Systems, Inc.
ICS8304I
L
OW
S
KEW
, 1-
TO
-4
LVCMOS / LVTTL F
ANOUT
B
UFFER
Test Conditions
IJ 166MHz
f = 133MHz
30% to 70%
30% to 70%
250
250
Minimum
2
Typical
Maximum
166
3.3
50
600
500
500
60
Units
MHz
ns
ps
ps
ps
ps
%
T
ABLE
4A. AC C
HARACTERISTICS
,
V
DD
= V
DDO
= 3.3V±5%, T
A
= -40°C
TO
85°C
Symbol Parameter
f
MAX
tp
LH
Output Frequency
Propagation Delay, Low-to-High; NOTE 1
Output Skew; NOTE 2, 4
Par t-to-Par t Skew; NOTE 3, 4
Output Rise Time
Output Fall Time
t
sk(o)
t
sk(pp)
t
R
t
F
odc
Output Duty Cycle
40
All parameters measured at 166MHz unless noted otherwise.
NOTE 1: Measured from V
DD
/2 of the input to V
DDO
/2 of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at V
DDO
/2.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at V
DDO
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
T
ABLE
3C. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= 3.3V±5%, V
DDO
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
V
DD
V
DDO
I
DD
I
DDO
Parameter
Positive Supply Voltage
Output Supply Voltage
Power Supply Current
Output Supply Current
Test Conditions
Minimum
3.135
2.375
Typical
3.3
2.5
Maximum
3.465
2.625
18
11
Units
V
V
mA
mA
T
ABLE
3D. LVCMOS / LVTTL DC C
HARACTERISTICS
,
V
DD
= 3.3V±5%, V
DDO
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
V
IH
V
IL
I
IH
I
IL
V
OH
Parameter
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
Output High Voltage; NOTE 1
V
DD
= V
IN
= 3.465V
V
DD
= 3.465V, V
IN
= 0V
-5
2.1
0.5
Test Conditions
Minimum
2
-0.3
Typical
Maximum
V
DD
+ 0.3
1.3
150
Units
V
V
µA
µA
V
V
Output Low Voltage; NOTE 1
V
OL
NOTE 1: Outputs terminated with 50
Ω
to V
DDO
/2. See Parameter Measurement Section,
"3.3V/2.5V Output Load Test Circuit".
8304AMI
www.icst.com/products/hiperclocks.html
4
REV. B APRIL 4, 2002
ICS [ INTEGRATED CIRCUIT SYSTEMS ]
