Integrated
Circuit
Systems, Inc.
ICS8304I
L
OW
S
KEW
, 1-
TO
-4
LVCMOS / LVTTL F
ANOUT
B
UFFER
4.6V
-0.5V to V
DD
+ 0.5V
-0.5V to V
DDO
+ 0.5V
112.7°C/W (0 lfpm)
-65°C to 150°C
A
BSOLUTE
M
AXIMUM
R
ATINGS
Supply Voltage, V
DDx
Inputs, V
I
Outputs, V
O
Package Thermal Impedance,
θ
JA
Storage Temperature, T
STG
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings
are stress specifications only. Functional operation of product at these conditions or any conditions beyond those listed in the
DC Characteristics
or
AC Characteristics
is not implied. Exposure to absolute maximum rating conditions for extended peri-
ods may affect product reliability.
T
ABLE
3A. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= V
DDO
= 3.3V±5%, T
A
= -40°C
TO
85°C
Symbol
V
DD
V
DDO
I
DD
I
DDO
Parameter
Power Supply Voltage
Output Power Supply Voltage
Power Supply Current
Output Supply Current
Test Conditions
Minimum
3.135
3.135
Typical
3.3
3.3
Maximum
3.465
3.465
18
11
Units
V
V
mA
mA
T
ABLE
3B. LVCMOS / LVTTL DC C
HARACTERISTICS
,
V
DD
= V
DDO
= 3.3V±5%, T
A
= -40°C
TO
85°C
Symbol
V
IH
V
IL
I
IH
I
IL
V
OH
Parameter
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
Output High Voltage
V
DD
= V
IN
= 3.465V
V
DD
= 3.465V, V
IN
= 0V
Refer to NOTE 1
I
OH
= -16mA
I
OH
= -100uA
Refer to NOTE 1
V
OL
Output Low Voltage
I
OL
= 16mA
I
OL
= 100uA
-5
2.6
2.9
3
0.5
0.25
0.15
Test Conditions
Minimum
2
-0.3
Typical
Maximum
V
DD
+ 0.3
1.3
150
Units
V
V
µA
µA
V
V
V
V
V
V
NOTE 1: Outputs terminated with 50
Ω
to V
DDO
/2. See Parameter Measurement Section, "3.3V Output Load Test Circuit".
8304AMI
www.icst.com/products/hiperclocks.html
3
REV. B APRIL 4, 2002
ICS [ INTEGRATED CIRCUIT SYSTEMS ]
