Integrated
Circuit
Systems, Inc.
ICS83026I
L
OW
S
KEW
, 1-
TO
-2
D
IFFERENTIAL
-
TO
-LVCMOS/LVTTL F
ANOUT
B
UFFER
Test Conditions
IJ 350MHz
Minimum
1.7
Typical
350
2.1
5
0.8V to 2V
150
300
2.5
20
600
450
60
Maximum
Units
MHz
ns
ps
ps
ps
%
T
ABLE
4. AC C
HARACTERISTICS
,
V
DD
= 3.3V±0.3V, T
A
= -40°C
TO
85°C
Symbol Parameter
f
MAX
t
PD
Output Frequency
Propagation Delay, NOTE 1
Output Skew; NOTE 2, 4
Par t-to-Par t Skew; NOTE 3, 4
Output Rise/Fall Time
t
sk(o)
t
sk(pp)
t
R
/ t
F
odc
Output Duty Cycle
40
50
All parameters measured at f
MAX
unless noted otherwise. See Parameter Measurement Information.
NOTE 1: Measured from the differential input crossing point to the output at V
DD
/2.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at V
DD
/2.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at V
DD
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
83026AMI
www.icst.com/products/hiperclocks.html
4
REV. B NOVEMBER 9, 2004
ICS [ INTEGRATED CIRCUIT SYSTEMS ]
