Integrated
Circuit
Systems, Inc.
ICS843-75
75MH
Z
, LVCMOS, LVPECL
D
UAL
O
UTPUT
O
SCILLATOR
Test Conditions
Minimum
Typical
Fundamental
25
±30
±30
18
±15
1
MHz
ppm
ppm
pF
ppm
mW
Maximum
Units
T
ABLE
4. C
RYSTAL
C
HARACTERISTICS
(NOTE 1)
Parameter
Mode of Oscillation
Frequency
Frequency Tolerance
Frequency Stability Over Operating
Temperature Range
Load Capacitance (C
L
); NOTE 2
Aging for 10 Years
Drive Level
NOTE 1: Using an HC49/US SMD package, the parameters shown above target ±100ppm accuracy.
NOTE 2: See
Cr ystal Input Interface
in the Application Information Section.
T
ABLE
5. AC C
HARACTERISTICS
,
V
CC
= V
CCO
= 3.3V±0.3V, T
A
= 0°C
TO
70°C
Symbol
f
OUT
t
DJ
t
RJ
t
RMS
t
p-p
t
OSC
t
R
/ t
F
odc
Parameter
Output Frequency
Deterministic Jitter ; NOTE 1
Random Jitter ; NOTE 1
RMS of Total Distribution (
σ
);
NOTE 2
Peak-to-Peak Jitter ; NOTE 1
Oscillation Star t Up Time
Output
Rise/Fall Time
Output
Duty Cycle
Q0
Q1/nQ1
20% to 80%
100
250
Test Conditions
Minimum
Typical
75
0.13
3.07
3.08
25
10
500
800
52
51
Maximum
Units
MHz
ps
ps
ps
ps
ms
ps
ps
%
%
Q0
48
Q1, nQ1
49
NOTE 1: Measured using Wavecrest SIA-3000.
NOTE 2: Measured using Wavecrest SIA-3000, Tj @ 10e-12BER result divided by 14.
843AG-75
www.icst.com/products/hiperclocks.html
4
REV. A JANUARY 9, 2006
ICS [ INTEGRATED CIRCUIT SYSTEMS ]
