Integrated
Circuit
Systems, Inc.
ICS85211BI-03
L
OW
S
KEW
, 1-
TO
-2
D
IFFERENTIAL
-
TO
-LVHSTL F
ANOUT
B
UFFER
Test Conditions
IJ 600MHz
Minimum
0.9
Typical
Maximum
700
1.3
30
250
20% to 80%
185
47
450
53
Units
MH z
ns
ps
ps
ps
%
T
ABLE
5. AC C
HARACTERISTICS
,
V
DD
= 3.3V ± 5%, T
A
= -40°C
TO
85°C
Symbol
f
MAX
t
PD
t
sk(o)
t
sk(pp)
t
R
/ t
F
o dc
Parameter
Output Frequency
Propagation Delay; NOTE 1
Output Skew; NOTE 2, 4
Par t-to-Par t Skew; NOTE 3, 4
Output Rise/Fall Time
Output Duty Cycle
IJ 266.6MHz
49
51
%
All parameters measured at 600MHz unless noted otherwise.
The cycle-to-cycle jitter on the input will equal the jitter on the output. The par t does not add jitter.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at output differential cross points.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load
conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
85211BMI-03
www.icst.com/products/hiperclocks.html
4
REV. B NOVEMBER 15, 2005
ICS [ INTEGRATED CIRCUIT SYSTEMS ]
