IBM0436A41DLAB IBM0418A41DLAB
IBM0418A81DLAB IBM0436A81DLAB
8Mb (256Kx36 & 512x18) and 4Mb (128Kx36 & 256Kx18) SRAM
Clock Truth Table
K
L→H
L→H
L→H
L→H
L→H
L→H
L→H
L→H
X
ZZ
L
L
L
L
L
L
L
L
H
SS
L
L
L
L
L
L
L
H
X
SW
H
L
L
L
L
L
L
X
X
SBWa
X
L
H
H
H
L
H
X
X
SBWb
X
H
L
H
H
L
H
X
X
SBWc
X
H
H
L
H
L
H
X
X
SBWd
X
H
H
H
L
L
H
X
X
DQ (n)
X
X
X
X
X
X
X
X
High-Z
DQ (n+1)
D
OUT
0-35
D
IN
0-8
D
IN
9-17
D
IN
18-26
D
IN
27-35
D
IN
0-35
High-Z
High-Z
High-Z
Mode
Read Cycle All Bytes
Write Cycle 1st Byte
Write Cycle 2nd Byte
Write Cycle 3rd Byte
Write Cycle 4th Byte
Write Cycle All Bytes
Abort Write Cycle
Deselect Cycle
Sleep Mode
Output Enable Truth Table
Operation (n, n+1)
Read
Read
Sleep (ZZ = H)
Write (SW = L)
Deselect (SS = H)
G (n)
L
H
X
X
X
DQ (n)
D
OUT
0-35
High-Z
High-Z
X
X
DQ (n+1)
D
OUT
0-35
High-Z
High-Z
High-Z
High-Z
Absolute Maximum Ratings
Item
Power Supply Voltage
Output Power Supply Voltage
Input Voltage
DQ Input Voltage
Operating Temperature
Junction Temperature
Storage Temperature
Short Circuit Output Current
Symbol
V
DD
V
DDQ
V
IN
V
DQIN
T
A
T
J
T
STG
I
OUT
Rating
-0.5 to 4.3
-0.5 to 2.825
-0.5 to 4.3
-0.5 to 2.825
0 to 85
110
-55 to +125
25
Units
V
V
V
V
°C
°C
°C
mA
Notes
1
1
1
1
1
1
1
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
reliability.
2. Excludes DQ inputs.
Page 6 of 25
crrh3319.10.fm.00
June 12, 2002
IBM [ IBM ]
