+12 V
D.U.T.
+12 V
1.2 kΩ
9.1 kΩ
V
CC
0.01 µF 0.01 µF
2.1 kΩ
100 Ω
Q
3
0.1 µF
0.1 µF
V
O
47 µF
Q
V
(1 M
2
O
Q
1
Ω, 12 pF
V
IN
V
B
TEST INPUT)
15 kΩ
470
Ω
100 Ω
R
F
51 Ω
1 kΩ
GND
SINGLE CHANNEL TESTING,
INDEPENDENT V DEVICES
22 Ω
CC
1N4150
TRIM FOR UNITY GAIN
Q , Q , Q : 2N3904
TYPICAL LINEARITY = +3 % AT V = 1 V
IN
TYPICAL SNR = 50 dB
1
2
3
P-P
TYPICAL R = 375 Ω
F
TYPICAL V dc = 3.8 V
O
TYPICAL I = 9 mA
F
+15
+10
T
= 25 °C
A
D.U.T.
+5 V
+15 V
INDEPENDENT
DEVICES
+5
0
V
CC
V
100 Ω
CC
SET I
20 kΩ
F
V
O
2N3053
1.6 Vdc
0.25 V
AC INPUT
-5
COMMON V
DEVICES
0.1 µF
CC
ac
P-P
-10
560 Ω
100 Ω
GND
-15
-20
COMMON
DEVICES
V
CC
0.1
1.0
10
100
f – FREQUENCY – MHz
Figure 8. Frequency Response.
PULSE GEN.
= 50 Ω
Z
O
D.U.T.
t = 5 ns
r
I
+5 V
F
V
CC
R
L
V
O
I
MONITOR
F
100 Ω
C * = 50 pF
L
GND
SINGLE CHANNEL
OR COMMON V DEVICES
CC
10 % DUTY CYCLE
1/f < 100 µs
NOTES:
* C INCLUDES PROBE AND STRAY WIRING CAPACITANCE.
L
BASE LEAD NOT CONNECTED.
Figure 9. Switching Test Circuit.*
*JEDEC Registered Data.
1-568
HP [ HEWLETT-PACKARD ]
