Package Characteristics
Over recommended operating conditions (T
A
= -55 to +125°C) unless otherwise specified.
Group A
Subgroups
(13)
1
Limits
Units
Min.
Typ.*
Max.
1.0
µA
5, 6
Fig
Note
Parameter
Input-Output
Leakage Current
Symbol
I
I-O
Test Conditions
V
I-O
= 1500Vdc
RH = 45%,
t = 5 sec.,
T
A
= 25°C
V
I-O
= 500 V
DC
f = 1 MHz
Resistance
(Input-Output)
Capacitance
(Input-Output)
R
I-O
C
I-O
10
10
2.5
Ω
6
6
pF
*All typicals at T
A
= 25°C.
Notes:
1. Maximum pulse width = 10
µ
s, maximum duty cycle = 0.2%. This value is intended to allow for component tolerances for designs with I
O
peak minimum
= 2.0 A. See Applications section for additional details on limiting I
OH
peak.
2. Maximum pulse width = 50
µ
s, maximum duty cycle = 0.5%.
4. Maximum pulse width = 1 ms, maximum duty cycle = 20%.
5. This is a momentary withstand test, not an operating condition.
6. Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted together.
7. The difference between t
PHL
and t
PLH
between any two HCPL-5120 parts under the same test condition.
8. Pins 1 and 4 need to be connected to LED common.
9. Common mode transient immunity in the high state is the maximum tolerable dV
CM
/dt of the common mode pulse, V
CM
, to assure that the output will
remain in the high state (i.e., V
O
> 15.0 V).
10. Common mode transient immunity in a low state is the maximum tolerable dV
CM
/dt of the common mode pulse, V
CM
, to assure that the output will
remain in a low state (i.e., V
O
< 1.0 V).
11. This load condition approximates the gate load of a 1200 V/75A IGBT.
12. Pulse Width Distortion (PWD) is defined as |t
PHL
-t
PLH
| for any given device.
13. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and Class H parts receive 100% testing at 25, 125, and -55°C (Subgroups 1 and 9,
2 and 10, 3 and 11, respectively).
14. Parameters are tested as part of device initial characterization and after design and process changes. Parameters are guaranteed to limits specified for
all lots not specifically tested.
3. In this test V
OH
is measured with a dc load current. When driving capacitive loads V
OH
will approach V
CC
as I
OH
approaches zero amps.
7