HT46R01M/HT46R02M/HT48R01M/HT48R02M
DC/DC Electrical Characteristics
Symbol
V
IN
DV
OUT
V
START
V
HOLD
I
IN
I
DD1
I
DD2
I
SHDN
V
IH
V
IL
I
LEAK
f
OSC
D
OSC
h
Note:
Parameter
Input Voltage
Output Voltage Tolerance
Start-up Voltage (Fig. 1)
Minimum Hold-on Voltage (Fig. 1)
No-load Input Current (Fig. 1)
Supply Current 1 (Fig. 2)
Supply Current 2 (Fig. 2)
Shutdown Current
CE High Threshold
CE Low Threshold
LX Leakage Current (Fig. 3)
Maximum Oscillator Frequency
(Fig. 3)
Oscillator Duty Cycle (Fig. 3)
Efficiency
V
IN
=V
OUT
´0.6;
I
OUT
=10mA; Ta=25°C (Unless otherwise specified)
Test Conditions
¾
¾
V
IN
: 0®2V; I
OUT
=1mA
V
IN
: 2®0V; I
OUT
=1mA
I
OUT
=0mA
V
S
=V
OUT
´0.95,
V
OUT
=3.0V
Measured at V
OUT
pin
V
S
=V
OUT
+0.5V
Measured at V
OUT
pin
CE=GND
¾
¾
V
S
=V
OUT
+0.5V, V
X
=6V
Measured at the LX pin
V
S
=V
OUT
´0.95
Measured at the LX pin
V
S
=V
OUT
´0.95
Measured at the LX pin
V
OUT
=3.0V
Min.
¾
-2.5
¾
¾
¾
¾
¾
¾
2
¾
¾
¾
65
¾
Typ.
¾
¾
0.7
¾
10
45
4
0.5
¾
¾
¾
115
75
85
Max.
3.3
2.5
0.9
0.7
20
68
7
1
¾
0.4
0.9
¾
85
¾
Unit
V
%
V
V
mA
mA
mA
mA
V
V
mA
kHz
%
%
Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating Ratings
indicate conditions for which the device is intended to be functional, but do not guarantee specific performance
limits. The guaranteed specifications apply only for the test conditions listed.
Test Circuit
1 0 0
m
H
1 N 5 8 1 7
V
O U T
V
IN
4 7
m
F
( T a n ta lu m )
L X
V O U T
1 0 0
m
F
( T a n ta lu m )
V
S
V O U T
L X
V
S
V O U T
L X
1 0 0
W
G N D
G N D
G N D
V
X
(F ig . 1 )
(F ig . 2 )
(F ig . 3 )
Rev. 1.00
7
December 18, 2009
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
