HT46R47E/HT46C47E
EEPROM D.C. Characteristics
Test Conditions
Symbol
V
CC
I
CC1
I
CC2
V
IL
V
IH
V
OL
I
LI
I
LO
I
STB1
I
STB2
C
IN
C
OUT
Note:
Parameter
V
CC
Operating Voltage
Operating Current
Operating Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Input Leakage Current
Output Leakage Current
Standby Current
Standby Current
Input Capacitance (See Note)
Output Capacitance (See Note)
¾
5V
5V
¾
¾
2.4V
5V
5V
5V
2.4V
¾
¾
Conditions
¾
Read at 100kHz
Write at 100kHz
¾
¾
I
OL
=2.1mA
V
IN
=0 or V
CC
V
OUT
=0 or V
CC
V
IN
=0 or V
CC
V
IN
=0 or V
CC
f=1MHz 25°C
f=1MHz 25°C
2.2
¾
¾
-1
0.7V
CC
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
5.5
2
5
0.3V
CC
V
CC
+0.5
0.4
1
1
4
3
6
8
V
mA
mA
V
V
V
mA
mA
mA
mA
pF
pF
Min.
Typ.
Max.
Unit
Ta=25°C
These parameters are periodically sampled but not 100% tested
V
CC
pad is wire-bonded to V
DD
pad of the HT46R47/HT46C47 die.
A.C. Characteristics
HT46R47/HT46C47
Test Conditions
Symbol
Parameter
V
DD
f
SYS
System Clock
Timer I/P Frequency
(TMR)
Watchdog Oscillator Period
5V
t
WDT1
t
WDT2
t
RES
t
SST
t
INT
t
AD
t
ADC
t
ADCS
Watchdog Time-out Period
(RC)
Watchdog Time-out Period
(System Clock)
External Reset Low Pulse Width
System Start-up Timer Period
Interrupt Pulse Width
A/D Clock Period
A/D Conversion Time
A/D Sampling Time
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
3V
Conditions
2.2V~5.5V
3.3V~5.5V
2.2V~5.5V
3.3V~5.5V
¾
¾
¾
¾
¾
Wake-up from HALT
¾
¾
¾
¾
400
400
0
0
45
32
2
15
2
17
1
¾
1
1
¾
¾
¾
¾
¾
¾
90
65
¾
¾
¾
1024
¾
¾
76
32
4000
8000
4000
8000
180
130
2
16
2
18
¾
¾
¾
¾
¾
¾
Min.
Typ.
Max.
Ta=25°C
Unit
kHz
kHz
kHz
kHz
ms
ms
t
WDTOSC
t
SYS
ms
*t
SYS
ms
ms
t
AD
t
AD
f
TIMER
t
WDTOSC
Note: *t
SYS
=1/f
SYS
Rev. 1.30
5
July 13, 2005
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
