HT45R37
Test Conditions
Conditions
Symbol
Parameter
I/O Port Source Current
PC0 Sink Current
Min.
Typ.
Max.
Unit
VDD
3V
5V
3V
5V
3V
5V
¾
mA
mA
mA
mA
kW
kW
V
-2
-5
0.8
2
-4
-8
1.5
4
¾
¾
IOH1
V
V
OH=0.9VDD
OL=0.1VDD
¾
¾
IOL2
¾
20
10
0
60
30
¾
100
50
Pull-high Resistance for I/O
Ports
RPH
VAD
AVDD
A/D Input Voltage
¾
¾
A/D Input Reference Voltage
Range
VREF
AVDD
¾
V
¾
¾
¾
¾
-2
-4
¾
2
AVDD=5V, VREF=AVDD
,
,
DNL
INL
A/C Differential Non-Linearity
ADC Integral Non-Linearity
LSB
LSB
t
AD=0.5ms
AVDD=5V, VREF=AVDD
AD=0.5ms
4
¾
t
3V
5V
0.5
1.5
1
3
mA
mA
¾
¾
Additional Power Consumption
if A/D Converter is Used
IADC
¾
Note: 1. 32768Hz is in slow start mode (RTCC.4=1) for the D.C. current measurement.
2. fS is the internal clock for Buzzer, RTC, Time base and WDT.
3. Both Timer/Event Counters are off. Timer filter is disabled for all test conditions.
4. All peripherals are in OFF condition if not mentioned at IDD, ISTB tests.
Rev. 1.20
6
February 25, 2011
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
