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HT36M4_07 参数 Datasheet PDF下载

HT36M4_07图片预览
型号: HT36M4_07
PDF下载: 下载PDF文件 查看货源
内容描述: 音乐合成器的8位MCU [Music Synthesizer 8-Bit MCU]
分类和应用:
文件页数/大小: 24 页 / 239 K
品牌: HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
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HT36M4  
Pad Coordinates  
Unit: mm  
Pad No.  
X
Y
Pad No.  
X
Y
1
2
1261.050  
1135.900  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
1146.750  
1146.750  
1146.750  
1146.750  
1146.750  
1146.750  
-153.300  
-253.300  
-363.900  
-463.900  
-1108.950  
-1076.600  
-1076.600  
-1146.750  
-1146.750  
-1146.750  
-1146.750  
-292.374  
-187.326  
-85.550  
-1250.000  
-1139.400  
-1039.400  
-928.800  
-828.800  
-286.200  
1256.550  
1256.550  
1256.550  
1256.550  
3
1030.900  
-460.600  
-1044.234  
-1147.786  
-1260.200  
-1256.550  
-1256.550  
-1256.550  
-1256.550  
4
5
6
7
8
9
10  
11  
25.050  
Pad Description  
Internal  
Connection  
Pad No.  
Pad Name  
I/O  
Function  
1
AUDIO  
VDDA, VSSA  
VDD, VSS  
OSC2  
O
¾
¾
O
I
Audio output  
DAC power supply  
Digital power supply, ground  
OUT or 1/4 system frequency in R mode (fOSC2=fOSC/8)  
¾
¾
¾
¾
2, 3  
7, 4  
5
X
6
OSC1  
X¢tal/Resistor XIN for X¢tal or ROSC in for resistor by mask option  
8
INT  
I
Pull-High  
External interrupt  
9
RES  
I
Reset input, active low  
¾
Pull-High  
or None  
17~10  
21~18  
PA7~PA0  
PB0~PB3  
I/O  
I/O  
Bidirectional 8-bit Input/Output port, wake-up by mask option  
Bidirectional 8-bit input/output port  
Pull-High  
or None  
Absolute Maximum Ratings  
Supply Voltage ..........................VSS-0.3V to VSS+5.5V  
Input Voltage .............................VSS-0.3V to VDD+0.3V  
Storage Temperature ...........................-50°C to 125°C  
Operating Temperature ..........................-25°C to 70°C  
Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maximum Ratings² may  
cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed  
in the specification is not implied and prolonged exposure to extreme conditions may affect device reliability.  
Rev. 1.10  
3
March 14, 2007  
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