HANBit
HMF1M32F2VSA
ERASE AND PROGRAMMING PERFORMANCE
LIMITS
PARAMETER
UNIT
COMMENTS
MIN.
TYP.
0.7
27
MAX.
Block Erase Time
-
15
sec
sec
ms
Excludes 00H programming
prior to erasure
Chip Erase Time
Word Programming Time
Chip Programming Time
-
-
11
330
36
Excludes system-level
overhead
12
sec
TSOP CAPACITANCE
PARAMETER
SYMBOL
PARAMETER
DESCRIPTION
TEST SETUP
MIN
MAX
UNIT
CIN
COUT
CIN2
Input Capacitance
VIN = 0
VOUT = 0
VIN = 0
-
-
-
10
10
10
pF
pF
pF
Output Capacitance
Control Pin Capacitance
Notes
: Capacitance is periodically sampled and not 100% tested.
TEST SPECIFICATIONS
TEST CONDITION
VALUE
UNIT
Output load
1TTL gate
Input rise and full times
5
0 to 3
1.5
ns
V
Input pulse levels
Input timing measurement reference levels
Output timing measurement reference levels
V
1.5
V
5.0V
2.7k
W
IN3064
or Equivalent
Device
Under
Test
CL
6.2k
W
Diodes = IN3064
or Equivalent
Note : CL = 100pF including jig capacitance
4
URL : www.hbe.co.kr
REV.02(August, 2002)
HANBit Electronics Co., Ltd.
HANBIT [ HANBIT ELECTRONICS CO.,LTD ]
