Preliminary
GS8160xxBT-xxxV
AC Test Conditions
Parameter
Conditions
V
– 0.2 V
Input high level
Input low level
DD
0.2 V
1 V/ns
/2
Figure 1
Output Load 1
Input slew rate
V
DQ
Input reference level
DD
V
/2
Output reference level
Output load
DDQ
*
50Ω
30pF
Fig. 1
Notes:
V
DDQ/2
* Distributed Test Jig Capacitance
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1
unless otherwise noted.
3. Device is deselected as defined by the Truth Table.
DC Electrical Characteristics
Parameter
Symbol
Test Conditions
Min
Max
Input Leakage Current
(except mode pins)
I
V = 0 to V
IN DD
–1 uA
1 uA
IL
I
V
≥ V ≥ 0 V
DD IN
FT, ZZ Input Current
–100 uA
–1 uA
100 uA
1 uA
IN
I
Output Disable, V
= 0 to V
Output Leakage Current
OL
OUT DD
DC Output Characteristics (1.8 V/2.5 V Version)
Parameter
Symbol
Test Conditions
Min
Max
—
V
I
= –4 mA, V
= 1.6 V
V
– 0.4 V
DDQ
1.8 V Output High Voltage
2.5 V Output High Voltage
1.8 V Output Low Voltage
2.5 V Output Low Voltage
OH1
OH
DDQ
V
I
= –8 mA, V
= 2.375 V
DDQ
1.7 V
—
OH2
OH
V
I
I
= 4 mA
= 8 mA
—
—
0.4 V
0.4 V
OL1
OL
OL
V
OL2
Rev: 1.01 5/2006
14/23
© 2004, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GSI [ GSI TECHNOLOGY ]
