February 2004 Version 1.0
FME/MS/DAC80/FL_2/5084
DK86064-1
Dual 14-bit 1GSa/s DAC Development Kit
Essential Equipment
Apart from the power supplies, equipment vital to
conducting an evaluation of the MB86064 is a
high quality RF clock and spectrum analyser.
The phase & spurious performance of the clock
should be such as to not limit the DAC
performance
(e.g.
HP8664A).
However,
performance of even the best spectrum
analysers available is inferior to that of the
converter. To overcome this, filtering techniques
and careful attention to analyser settings, e.g.
RF Attenuation, is essential during the course of
the evaluation.
generating equipment is available, initial testing
using the waveform memories serves as a useful
setup check.
Pattern
generators
can be connected to
the General Purpose
Motherboard
using
either the on-board 2-
row 0.1” data headers,
or the optional SMA
Adaptors. When using
the 0.1” data headers
it is assumed that a
custom wiring harness
will be required. This
would be
made
according
to
the
connector type and
pinout
of
the
generator’s
output.
The optional SMA
Adaptors provide a convenient conversion from
SMA to the Motherboard’s 0.1” headers. This
simplifies the simultaneous removal of 28 SMAs
(14-bit differential LVDS) when required. One
advantage of this is the ability to swap the data
generator easily between DAC data ports if
insufficient channels are available to drive both
ports simultaneously.
Rather than using general purpose test
equipment, customers may wish to use parts of
the development kit to construct an evaluation
platform more representative of their end
application. This might, for example, involve an
FPGA to implement a variety of pre-processing
and/or waveform generation. At the simplest
level, a setup similar to that described for the
digital pattern generator could be used, where a
custom wiring harness interfaces a standard or
existing FPGA evaluation platform to the
Motherboard. Control of the DAC from the PC
software can be maintained to minimise effort to
get up and running.
Alternatively, an FPGA board could be designed
with a DAC interface connector compatible with
the Fujitsu DAC Module’s 114-pin Mictor
Copyright © 2004 Fujitsu Microelectronics Europe GmbH
Driving the DAC
As with any DAC evaluation, an appropriate
stimulus [test vector] is required. Unfortunately at
data rates above 300MSa/s this requires digital
pattern generation capabilities beyond most
standard test equipment. The DK86064-1
Development Kit has been designed to help
overcome this difficulty in a number of ways.
Initially, simple unmodulated or pseudo-
modulated single and multi-tone tests can be
conducted using waveforms downloaded to the
device’s on-chip waveform memories.
Test waveforms are easily loaded into the
waveform memories, via a USB interface, using
the PC software supplied with the main
Motherboard. Even if high speed digital pattern
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Disclaimer:
The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales representatives before
ordering.The information and circuit diagrams in this document are presented “as is”, no license is granted by implication or otherwise.
FUJITSU [ FUJITSU COMPONENT LIMITED. ]
