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AM29LV010B-70JD 参数 Datasheet PDF下载

AM29LV010B-70JD图片预览
型号: AM29LV010B-70JD
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash, 128KX8, 70ns, PQCC32]
分类和应用: 内存集成电路
文件页数/大小: 36 页 / 1017 K
品牌: FUJITSU [ FUJITSU ]
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D A T A S H E E T  
GENERAL DESCRIPTION  
The Am29LV010B is a 1 Mbit, 3.0 Volt-only Flash  
memory device organized as 131,072 bytes. The  
Am29LV010B has a uniform sector architecture.  
Erase algorithm—an internal algorithm that automati-  
cally preprograms the array (if it is not already  
programmed) before executing the erase operation.  
During erase, the device automatically times the erase  
pulse widths and verifies proper cell margin.  
The device is offered in 32-pin PLCC and 32-pin TSOP  
packages. The byte-wide (x8) data appears on DQ7-DQ0.  
All read, erase, and program operations are accomplished  
using only a single power supply. The device can also be  
programmed in standard EPROM programmers.  
The host system can detect whether a program or  
erase operation is complete by reading the DQ7 (Data#  
Polling) and DQ6 (toggle) status bits. After a program  
or erase cycle has been completed, the device is ready  
to read array data or accept another command.  
The standard Am29LV010B offers access times of 55,  
70, and 90 ns (100 ns part is also available), allowing  
high speed microprocessors to operate without wait  
states. To eliminate bus contention, the device has sep-  
arate chip enable (CE#), write enable (WE#) and  
output enable (OE#) controls.  
The sector erase architecture allows memory sectors  
to be erased and reprogrammed without affecting the  
data contents of other sectors. The device is fully  
erased when shipped from the factory.  
The device requires only a single power supply  
(2.7V-3.6V) for both read and write functions. Internally  
generated and regulated voltages are provided for the  
program and erase operations.  
Hardware data protection measures include a low  
V
detector that automatically inhibits write opera-  
CC  
tions during power transitions. The hardware sector  
protection feature disables both program and erase  
operations in any combination of the sectors of  
memory. This can be achieved in-system or via pro-  
gramming equipment.  
The device is entirely command set compatible with the  
JEDEC single-power-supply Flash standard. Com-  
mands are written to the command register using  
standard microprocessor write timings. Register con-  
tents serve as input to an internal state-machine that  
controls the erase and programming circuitry. Write  
cycles also internally latch addresses and data needed  
for the programming and erase operations. Reading  
data out of the device is similar to reading from other  
Flash or EPROM devices.  
The Erase Suspend feature enables the user to put  
erase on hold for any period of time to read data from,  
or program data to, any sector that is not selected for  
erasure. True background erase can thus be achieved.  
The device offers two power-saving features. When  
addresses have been stable for a specified amount of  
time, the device enters the automatic sleep mode.  
The system can also place the device into the standby  
mode. Power consumption is greatly reduced in both  
these modes.  
Device programming occurs by executing the program  
command sequence. This initiates the Embedded  
Program algorithm—an internal algorithm that auto-  
matically times the program pulse widths and verifies  
proper cell margin. The Unlock Bypass mode facili-  
tates faster programming times by requiring only two  
write cycles to program data instead of four.  
AMD’s Flash technology combines years of Flash  
memory manufacturing experience to produce the  
highest levels of quality, reliability and cost effectiveness.  
The device electrically erases all bits within a sector  
simultaneously via Fowler-Nordheim tunneling. The  
data is programmed using hot electron injection.  
Device erasure occurs by executing the erase  
command sequence. This initiates the Embedded  
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Am29LV010B  
22140D6 October 11, 2006  
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