MBM29LV800TE/BE60/70/90
■ ERASE AND PROGRAMMING PERFORMANCE
Limits
Parameter
Unit
s
Comments
Min
Typ
Max
Excludes programming time
prior to erasure
Sector Erase Time
1
10
Byte Programming Time
Word Programming Time
8
300
360
Excludes system-level
overhead
µs
16
Excludes system-level
overhead
Chip Programming Time
Erase/Program Cycle
8.4
25
s
100,000
cycle
■ TSOP (1) , FBGA, CSOP PIN CAPACITANCE
Parameter
Input Capacitance
Symbol
CIN
Test Setup
Typ
Max
9.5
Unit
pF
VIN = 0
7.5
8.0
Output Capacitance
COUT
CIN2
VOUT = 0
VIN = 0
10.0
13.0
pF
Control Pin Capacitance
10.0
pF
Notes : • Test conditions TA = +25 °C, f = 1.0 MHz
• DQ15/A-1 pin capacitance is stipulated by output capacitance.
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