MC33910G5AC/MC3433910G5AC
DEVICE VARIATIONS
DEVICE VARIATIONS
The 33910G5 data sheet is within MC33910G5 Product
Specifications Pages 3 to 46
The 33910BAC data sheet is within MC33911BAC
Product Specifications Pages 47 to 86
Table 1. This specification support the following products
Device
Temperature
Generation
Changes
1. Increase ESD GUN IEC61000-4-2 (gun test contact with 150 pF, 330 W
test conditions) performance to achieve ±6.0 kV min on the LIN pin.
2. Immunity against ISO7637 pulse 3b
MC33910G5AC/R2
-40 to 125°C
2.5
3. Reduce EMC emission level on LIN
4. Improve EMC immunity against RF – target new specification including
3x68 pF
MC34910G5AC/R2
-40 to 85°C
2.5
5. Comply with J2602 conformance test
MC33910BAC/R2
MC34910BAC/R2
-40 to 125°C
-40 to 85°C
2.0
2.0
Initial release
33910
Analog Integrated Circuit Device Data
Freescale Semiconductor
2
FREESCALE [ Freescale ]
