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33742S 参数 Datasheet PDF下载

33742S图片预览
型号: 33742S
PDF下载: 下载PDF文件 查看货源
内容描述: 系统基础芯片( SBC)与增强型高速CAN收发器 [System Basis Chip (SBC) with Enhanced High-Speed CAN Transceiver]
分类和应用:
文件页数/大小: 65 页 / 1605 K
品牌: FREESCALE [ Freescale ]
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ADDITIONAL DOCUMENTATION  
THERMAL ADDENDUM (REV 2.0)  
ADDITIONAL DOCUMENTATION  
33742DW  
33742EG  
THERMAL ADDENDUM (REV 2.0)  
Introduction  
This thermal addendum is provided as a supplement to the MC33742  
technical datasheet. The addendum provides thermal performance  
information that may be critical in the design and development of system  
applications. All electrical, application, and packaging information is  
provided in the data sheet.  
28-PIN  
SOICW  
Packaging and Thermal Considerations  
The MC33742 is offered in a 28 pin SOICW exposed pad, single die  
package. There is a single heat source (P), a single junction temperature  
(TJ), and thermal resistance (RθJA).  
TJ  
.
=
RθJA  
P
DW SUFFIX  
EG SUFFIX (PB-FREE)  
98ASB42345B  
The stated values are solely for a thermal performance comparison of  
one package to another in a standardized environment. This methodology  
is not meant to and will not predict the performance of a package in an  
application-specific environment. Stated values were obtained by  
measurement and simulation according to the standards listed below.  
28-PIN SOICW  
Note For package dimensions, refer to  
the 33742 data sheet.  
Standards  
1.0  
Table 43. Thermal Performance Comparison  
0.2  
Thermal Resistance  
[°C/W]  
41  
1.0  
(1) (2)  
R
R
R
R
θJA  
θJB  
θJA  
θJC  
(2) (3)  
(1) (4)  
(5)  
10  
0.2  
* All measurements  
are in millimeters  
68  
220  
Notes:  
1. Per JEDEC JESD51-2 at natural convection, still air  
condition.  
28 Pin SOICW  
1.27 mm Pitch  
16.0 mm x 7.5 mm Body  
2. 2s2p thermal test board per JEDEC JESD51-7.  
3. Per JEDEC JESD51-8, with the board temperature on the  
center trace near the center lead.  
Figure 38. Surface Mount for SOIC Wide Body  
non-Exposed Pad  
4. Single layer thermal test board per JEDEC JESD51-3.  
5. Thermal resistance between the die junction and the  
package top surface; cold plate attached to the package top  
surface and remaining surfaces insulated.  
33742  
Analog Integrated Circuit Device Data  
Freescale Semiconductor  
61  
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